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Bryce Arthur Bingham
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Boulder, CO, US
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last 30 patents
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Patent Grant
Wafer alignment device
Patent number
9,846,022
Issue date
Dec 19, 2017
Dieterich Standard, Inc.
Nathaniel Kirk Kenyon
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
WAFER ALIGNMENT DEVICE
Publication number
20170089685
Publication date
Mar 30, 2017
Dieterich Standard, Inc.
Nathaniel Kirk Kenyon
G01 - MEASURING TESTING
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Patent Application
RODABLE PRESSURE COUPLING
Publication number
20160175897
Publication date
Jun 23, 2016
Dieterich Standard, Inc.
John Henry Stehle
B08 - CLEANING