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Bumjoo LEE

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Patents Applicationslast 30 patents

  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE DEVICE
    • Publication number 20250218721
    • Publication date Jul 3, 2025
    • Samsung Electronics Co., Ltd.
    • Jinwoo Lee
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    METHOD OF GENERATING DEFECT CLASSIFICATION MODEL
    • Publication number 20250037486
    • Publication date Jan 30, 2025
    • Samsung Electronics Co., Ltd.
    • Jinwoo LEE
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    METHOD OF INSPECTING DEFECTS
    • Publication number 20250014169
    • Publication date Jan 9, 2025
    • Samsung Electronics Co., Ltd.
    • Bumjoo LEE
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    SUBSTRATE INSPECTION METHOD
    • Publication number 20240412943
    • Publication date Dec 12, 2024
    • Samsung Electronics Co., LTD
    • Jinwoo Lee
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    IMAGE PROCESSING METHOD AND IMAGE PROCESSING SYSTEM
    • Publication number 20240202879
    • Publication date Jun 20, 2024
    • Samsung Electronics Co., Ltd.
    • Jinwoo LEE
    • G06 - COMPUTING CALCULATING COUNTING