Bumsuk CHUNG

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Hwaseong-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Distribution output device and operating method
- Patent number 12,111,879
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Hakgyun Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device defect analysis method
- Patent number 11,668,743
- Issue date Jun 6, 2023
- Samsung Electronics Co., Ltd.
- Hakgyun Kim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR TESTING AND MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20230305055
- Publication date Sep 28, 2023
- Samsung Electronics Co., Ltd.
- Bumsuk Chung
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING ABNORMALITY
- Publication number 20230085028
- Publication date Mar 16, 2023
- Samsung Electronics Co., Ltd.
- Jiho GHIL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD ESTIMATING BREAKDOWN VOLTAGE OF SILICON DIOXID...
- Publication number 20220236313
- Publication date Jul 28, 2022
- Samsung Electronics Co., Ltd.
- Bumsuk CHUNG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE DEFECT ANALYSIS METHOD
- Publication number 20220236314
- Publication date Jul 28, 2022
- Samsung Electronics Co., Ltd.
- Hakgyun KIM
- G01 - MEASURING TESTING
Information Patent Application
DISTRIBUTION OUTPUT DEVICE AND OPERATING METHOD
- Publication number 20220216115
- Publication date Jul 7, 2022
- Samsung Electronics Co., Ltd.
- HAKGYUN KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER DEFECT PREDICTION DEVICE AND OPERATING METHOD THEREOF
- Publication number 20220207216
- Publication date Jun 30, 2022
- Samsung Electronics Co., Ltd.
- Bumsuk CHUNG
- G06 - COMPUTING CALCULATING COUNTING