Bunta MATSUHANA

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray phase imaging system
- Patent number 12,072,302
- Issue date Aug 27, 2024
- Shimadzu Corporation
- Bunta Matsuhana
- G01 - MEASURING TESTING
Information Patent Grant
X-ray imaging apparatus
- Patent number 11,662,322
- Issue date May 30, 2023
- Shimadzu Corporation
- Bunta Matsuhana
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspection device, management server for X-ray inspection dev...
- Patent number 11,656,189
- Issue date May 23, 2023
- Shimadzu Corporation
- Futoshi Ueki
- G01 - MEASURING TESTING
Information Patent Grant
Deterioration determination method and deterioration determination...
- Patent number 11,599,990
- Issue date Mar 7, 2023
- Shimadzu Corporation
- Bunta Matsuhana
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray inspection apparatus and deterioration determination method f...
- Patent number 11,490,498
- Issue date Nov 1, 2022
- Shimadzu Corporation
- Bunta Matsuhana
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray imaging apparatus and consumption level estimation method for...
- Patent number 11,450,502
- Issue date Sep 20, 2022
- Shimadzu Corporation
- Bunta Matsuhana
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray inspection device and method for determining degree of consum...
- Patent number 10,820,399
- Issue date Oct 27, 2020
- Shimadzu Corporation
- Bunta Matsuhana
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray generation device, X-ray fluoroscopic image photographing dev...
- Patent number 10,631,391
- Issue date Apr 21, 2020
- Shimadzu Corporation
- Futoshi Ueki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection system
- Patent number 10,398,012
- Issue date Aug 27, 2019
- Shimadzu Corporation
- Bunta Matsuhana
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY PHASE IMAGING SYSTEM
- Publication number 20230194441
- Publication date Jun 22, 2023
- Shimadzu Corporation
- Bunta MATSUHANA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY IMAGING APPARATUS AND CONSUMPTION LEVEL ESTIMATION METHOD FOR...
- Publication number 20220208502
- Publication date Jun 30, 2022
- Shimadzu Corporation
- Bunta MATSUHANA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETERIORATION DETERMINATION METHOD AND DETERIORATION DETERMINATION...
- Publication number 20220207683
- Publication date Jun 30, 2022
- Shimadzu Corporation
- Bunta MATSUHANA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20220170868
- Publication date Jun 2, 2022
- Shimadzu Corporation
- Bunta MATSUHANA
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY INSPECTION DEVICE, MANAGEMENT SERVER FOR X-RAY INSPECTION DEV...
- Publication number 20220155244
- Publication date May 19, 2022
- Shimadzu Corporation
- Futoshi UEKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND DETERIORATION DETERMINATION METHOD F...
- Publication number 20220151050
- Publication date May 12, 2022
- Shimadzu Corporation
- Bunta MATSUHANA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY INSPECTION DEVICE AND METHOD FOR DETERMINING DEGREE OF CONSUM...
- Publication number 20190380193
- Publication date Dec 12, 2019
- Shimadzu Corporation
- Bunta MATSUHANA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
X-RAY GENERATION DEVICE, X-RAY FLUOROSCOPIC IMAGE PHOTOGRAPHING DEV...
- Publication number 20190082524
- Publication date Mar 14, 2019
- Shimadzu Corporation
- Futoshi UEKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION SYSTEM
- Publication number 20180110115
- Publication date Apr 19, 2018
- Shimadzu Corporation
- Bunta MATSUHANA
- G01 - MEASURING TESTING

Bunta MATSUHANA

Person

Patents Grantslast 30 patents

X-ray phase imaging system

X-ray imaging apparatus

X-ray inspection device, management server for X-ray inspection dev...

Deterioration determination method and deterioration determination...

X-ray inspection apparatus and deterioration determination method f...

X-ray imaging apparatus and consumption level estimation method for...

X-ray inspection device and method for determining degree of consum...

X-ray generation device, X-ray fluoroscopic image photographing dev...

X-ray inspection system

Patents Applicationslast 30 patents

X-RAY PHASE IMAGING SYSTEM

X-RAY IMAGING APPARATUS AND CONSUMPTION LEVEL ESTIMATION METHOD FOR...

DETERIORATION DETERMINATION METHOD AND DETERIORATION DETERMINATION...

X-RAY IMAGING APPARATUS

X-RAY INSPECTION DEVICE, MANAGEMENT SERVER FOR X-RAY INSPECTION DEV...

X-RAY INSPECTION APPARATUS AND DETERIORATION DETERMINATION METHOD F...

X-RAY INSPECTION DEVICE AND METHOD FOR DETERMINING DEGREE OF CONSUM...

X-RAY GENERATION DEVICE, X-RAY FLUOROSCOPIC IMAGE PHOTOGRAPHING DEV...

X-RAY INSPECTION SYSTEM