Byeongdae Park

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Cheonan-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Universal frame for testing semiconductor device
- Patent number 8,251,729
- Issue date Aug 28, 2012
- Samsung Electronics Co., Ltd.
- Jounghee Shin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
UNIVERSAL FRAME FOR TESTING SEMICONDUCTOR DEVICE
- Publication number 20110176864
- Publication date Jul 21, 2011
- Jounghee SHIN
- G01 - MEASURING TESTING