Byeonghwan Jeon

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Kyungki-do, KR

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for and method of performing inspection and metrology pro...
- Patent number 10,732,129
- Issue date Aug 4, 2020
- SAMASUNG ELECTRONICS CO., LTD.
- Kwang Soo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus, semiconductor device manufacturing system inc...
- Patent number 10,489,902
- Issue date Nov 26, 2019
- Samsung Electronics Co., Ltd.
- Kwang Soo Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device for inspecting wafer and method of inspecting waf...
- Patent number 10,474,133
- Issue date Nov 12, 2019
- Samsung Electronics Co., Ltd.
- Janghee Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical inspection apparatus, a method of inspecting a substrate, a...
- Patent number 9,915,623
- Issue date Mar 13, 2018
- Samsung Electronics Co., Ltd.
- Kwang Soo Kim
- G02 - OPTICS
Information Patent Grant
Graphics overlay device
- Patent number 5,883,610
- Issue date Mar 16, 1999
- Samsung Electronics Co., Ltd.
- Byeonghwan Jeon
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Apparatus for measuring degree of inclination of objective lens for...
- Patent number 5,742,383
- Issue date Apr 21, 1998
- Samsung Electronics Co., Ltd.
- Byeonghwan Jeon
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS FOR AND METHOD OF PERFORMING INSPECTION AND METROLOGY PRO...
- Publication number 20190376908
- Publication date Dec 12, 2019
- Sakmsung Electronics Co., Ltd.
- Kwang Soo Kim
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION SYSTEM
- Publication number 20180164227
- Publication date Jun 14, 2018
- Samsung Electronics Co., Ltd.
- Taejoong KIM
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE FOR INSPECTING WAFER AND METHOD OF INSPECTING WAF...
- Publication number 20180150057
- Publication date May 31, 2018
- Samsung Electronics Co., Ltd.
- Janghee LEE
- G05 - CONTROLLING REGULATING
Information Patent Application
INSPECTION APPARATUS, SEMICONDUCTOR DEVICE MANUFACTURING SYSTEM INC...
- Publication number 20170116727
- Publication date Apr 27, 2017
- Samsung Electronics Co., Ltd.
- Kwang Soo KIM
- G02 - OPTICS
Information Patent Application
OPTICAL INSPECTION APPARATUS, A METHOD OF INSPECTING A SUBSTRATE, A...
- Publication number 20170082552
- Publication date Mar 23, 2017
- Samsung Electronics Co., Ltd.
- Kwang Soo Kim
- G02 - OPTICS
Information Patent Application
SURFACE LIGHT SOURCE USING ARRAYED POINT LIGHT SOURCES
- Publication number 20150308654
- Publication date Oct 29, 2015
- Samsung Electronics Co., Ltd.
- YOUNGKYU PARK
- F21 - LIGHTING