Byoung-Youl Min

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Cupertino, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Membrane probing of circuits
- Patent number 5,847,571
- Issue date Dec 8, 1998
- MicroModule Systems
- Ken Kuang-Fu Liu
- G01 - MEASURING TESTING
Information Patent Grant
Exchangeable membrane probe testing of circuits
- Patent number 5,841,291
- Issue date Nov 24, 1998
- MicroModule Systems
- Ken Kuang-Fu Liu
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing of circuits
- Patent number 5,623,213
- Issue date Apr 22, 1997
- MicroModule Systems
- Ken K. F. Liu
- G01 - MEASURING TESTING