Byoungjun Min

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Cheonan-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Test handler that rapidly transforms temperature and method of test...
- Patent number 9,207,272
- Issue date Dec 8, 2015
- Samsung Eletronics Co., Ltd.
- Jea-Muk Oh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FACILITY AND A METHOD FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20140306727
- Publication date Oct 16, 2014
- Samsung Electronics Co., Ltd.
- Kyungsook Lee
- G01 - MEASURING TESTING
Information Patent Application
TEST HANDLER THAT RAPIDLY TRANSFORMS TEMPERATURE AND METHOD OF TEST...
- Publication number 20140077829
- Publication date Mar 20, 2014
- Samsung Electronics Co., Ltd.
- Jea-Muk OH
- G01 - MEASURING TESTING
Information Patent Application
CARRIER TAPE WINDING UNIT AND APPARATUS OF PACKING SEMICONDUCTOR PA...
- Publication number 20130074447
- Publication date Mar 28, 2013
- Samsung Electronics Co., Ltd.
- Ki-hun Kim
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
TEST SOCKET, TEST APPARATUS WITH TEST SOCKET
- Publication number 20100164525
- Publication date Jul 1, 2010
- Samsung Electronics Co., Ltd.
- Jongwong HAN
- G01 - MEASURING TESTING