Byron Harry Gibbs

Person

McKinney, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Hyperbaric saw for sawing packaged devices
- Patent number 11,676,829
- Issue date Jun 13, 2023
- Texas Instruments Incorporated
- Byron Harry Gibbs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing semiconductor components
- Patent number 11,201,065
- Issue date Dec 14, 2021
- Texas Instruments Incorporated
- Enis Tuncer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal pad shorts test for wire bonded strip testing
- Patent number 8,994,397
- Issue date Mar 31, 2015
- Texas Instruments Incorporated
- Byron Harry Gibbs
- G01 - MEASURING TESTING
Information Patent Grant
Contactor with multi-pin device contacts
- Patent number 8,912,810
- Issue date Dec 16, 2014
- Texas Instruments Incorporated
- Stanley Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Test handler automatic contactor cleaner methods and surrogate clea...
- Patent number 7,772,830
- Issue date Aug 10, 2010
- Texas Instruments Incorporated
- Jerry Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Contact mechanism cleaning
- Patent number 7,474,089
- Issue date Jan 6, 2009
- Texas Instruments Incorporated
- Byron Harry Gibbs
- G01 - MEASURING TESTING
Information Patent Grant
System and method for the probing of a wafer
- Patent number 7,068,056
- Issue date Jun 27, 2006
- Texas Instruments Incorporated
- Byron H. Gibbs
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HYPERBARIC SAW FOR SAWING PACKAGED DEVICES
- Publication number 20220208571
- Publication date Jun 30, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Byron Harry Gibbs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING SEMICONDUCTOR COMPONENTS
- Publication number 20220108896
- Publication date Apr 7, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Enis TUNCER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING SEMICONDUCTOR COMPONENTS
- Publication number 20210134610
- Publication date May 6, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Enis TUNCER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMAL PAD SHORTS TEST FOR WIRE BONDED STRIP TESTING
- Publication number 20130120019
- Publication date May 16, 2013
- TEXAS INSTRUMENTS INCORPORATED
- BYRON HARRY GIBBS
- G01 - MEASURING TESTING
Information Patent Application
CONTACTOR WITH MULTI-PIN DEVICE CONTACTS
- Publication number 20130063172
- Publication date Mar 14, 2013
- TEXAS INSTRUMENTS INCORPORATED
- STANLEY HSU
- G01 - MEASURING TESTING
Information Patent Application
Contact mechanism cleaning
- Publication number 20080156352
- Publication date Jul 3, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Byron Harry Gibbs
- G01 - MEASURING TESTING
Information Patent Application
Test handler automatic contactor cleaner methods and surrogate clea...
- Publication number 20070205753
- Publication date Sep 6, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Jerry Hau
- G01 - MEASURING TESTING
Information Patent Application
System and method for the probing of a wafer
- Publication number 20060071679
- Publication date Apr 6, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Byron H. Gibbs
- G01 - MEASURING TESTING

Byron Harry Gibbs

Person

Patents Grantslast 30 patents

Hyperbaric saw for sawing packaged devices

Testing semiconductor components

Thermal pad shorts test for wire bonded strip testing

Contactor with multi-pin device contacts

Test handler automatic contactor cleaner methods and surrogate clea...

Contact mechanism cleaning

System and method for the probing of a wafer

Patents Applicationslast 30 patents

HYPERBARIC SAW FOR SAWING PACKAGED DEVICES

TESTING SEMICONDUCTOR COMPONENTS

TESTING SEMICONDUCTOR COMPONENTS

THERMAL PAD SHORTS TEST FOR WIRE BONDED STRIP TESTING

CONTACTOR WITH MULTI-PIN DEVICE CONTACTS

Contact mechanism cleaning

Test handler automatic contactor cleaner methods and surrogate clea...

System and method for the probing of a wafer