Byron J R Shulver

Person

Kilmacolm, PA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Thermistor with tunable resistance
- Patent number 11,047,746
- Issue date Jun 29, 2021
- Texas Instruments Incorporated
- Keith Ryan Green
- G01 - MEASURING TESTING
Information Patent Grant
Tilted segmented anisotropic magneto-resistive angular sensor
- Patent number 10,782,154
- Issue date Sep 22, 2020
- Texas Instruments Incorporated
- Byron Jon Roderick Shulver
- G01 - MEASURING TESTING
Information Patent Grant
Thermistor with tunable resistance
- Patent number 10,663,355
- Issue date May 26, 2020
- Texas Instruments Incorporated
- Keith Ryan Green
- G01 - MEASURING TESTING
Information Patent Grant
Vertical hall-effect sensor for detecting two-dimensional in-plane...
- Patent number 10,534,045
- Issue date Jan 14, 2020
- Texas Instruments Incorporated
- Keith Ryan Green
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic core
- Patent number 10,199,573
- Issue date Feb 5, 2019
- Texas Instruments Incorporated
- Mona Eissa
- G01 - MEASURING TESTING
Information Patent Grant
Selective patterning of titanium encapsulation layers
- Patent number 10,005,662
- Issue date Jun 26, 2018
- Texas Instruments Incorporated
- Lee Alan Stringer
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Selective patterning of an integrated fluxgate device
- Patent number 9,771,261
- Issue date Sep 26, 2017
- Texas Instruments Incorporated
- Lee Alan Stringer
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for patterning of laminated magnetic layer
- Patent number 9,633,866
- Issue date Apr 25, 2017
- Texas Instruments Incorporated
- Byron J R Shulver
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
THERMISTOR WITH TUNABLE RESISTANCE
- Publication number 20200240849
- Publication date Jul 30, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Keith Ryan Green
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL HALL-EFFECT SENSOR FOR DETECTING TWO-DIMENSIONAL IN-PLANE...
- Publication number 20190086484
- Publication date Mar 21, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Keith Ryan Green
- G01 - MEASURING TESTING
Information Patent Application
THERMISTOR WITH TUNABLE RESISTANCE
- Publication number 20190003900
- Publication date Jan 3, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Keith Ryan Green
- G01 - MEASURING TESTING
Information Patent Application
TILTED SEGMENTED ANISOTROPIC MAGNETO-RESISTIVE ANGULAR SENSOR
- Publication number 20180372511
- Publication date Dec 27, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Byron Jon Roderick Shulver
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC CORE
- Publication number 20170346000
- Publication date Nov 30, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Mona Eissa
- G01 - MEASURING TESTING
Information Patent Application
SELECTIVE PATTERNING OF TITANIUM ENCAPSULATION LAYERS
- Publication number 20170341934
- Publication date Nov 30, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Lee Alan Stringer
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Selective Patterning of an Integrated Fluxgate Device
- Publication number 20170267521
- Publication date Sep 21, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Lee Alan Stringer
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Byron J R Shulver

Person

Patents Grantslast 30 patents

Thermistor with tunable resistance

Tilted segmented anisotropic magneto-resistive angular sensor

Thermistor with tunable resistance

Vertical hall-effect sensor for detecting two-dimensional in-plane...

Magnetic core

Selective patterning of titanium encapsulation layers

Selective patterning of an integrated fluxgate device

Method for patterning of laminated magnetic layer

Patents Applicationslast 30 patents

THERMISTOR WITH TUNABLE RESISTANCE

VERTICAL HALL-EFFECT SENSOR FOR DETECTING TWO-DIMENSIONAL IN-PLANE...

THERMISTOR WITH TUNABLE RESISTANCE

TILTED SEGMENTED ANISOTROPIC MAGNETO-RESISTIVE ANGULAR SENSOR

MAGNETIC CORE

SELECTIVE PATTERNING OF TITANIUM ENCAPSULATION LAYERS

Selective Patterning of an Integrated Fluxgate Device