Byung I. Kim

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Single crystalline silicon stack formation and bonding to a cmos wafer
- Patent number 12,224,201
- Issue date Feb 11, 2025
- Micron Technology, Inc.
- Si-Woo Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatuses including Finfets having different gate oxide configura...
- Patent number 12,199,094
- Issue date Jan 14, 2025
- Micron Technology, Inc.
- Hyuck Soo Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Buried connection line for peripheral area of a memory device
- Patent number 12,063,797
- Issue date Aug 13, 2024
- Micron Technology, Inc.
- Kyuseok Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vertical contacts for semiconductor devices
- Patent number 12,052,858
- Issue date Jul 30, 2024
- Micron Technology, Inc.
- Byung Yoon Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conductive line contact regions having multiple multi-direction con...
- Patent number 11,903,183
- Issue date Feb 13, 2024
- Micron Technology, Inc.
- Byung Yoon Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Single crystalline silicon stack formation and bonding to a CMOS wafer
- Patent number 11,869,803
- Issue date Jan 9, 2024
- Micron Technology, Inc.
- Si-Woo Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contacts for twisted conductive lines within memory arrays
- Patent number 11,791,260
- Issue date Oct 17, 2023
- Micron Technology, Inc.
- Byung Yoon Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-direction conductive line and staircase contact for semicondu...
- Patent number 11,696,432
- Issue date Jul 4, 2023
- Micron Technology, Inc.
- Si-Woo Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vertical contacts for semiconductor devices
- Patent number 11,631,681
- Issue date Apr 18, 2023
- Micron Technology, Inc.
- Byung Yoon Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single crystalline silicon stack formation and bonding to a CMOS wafer
- Patent number 11,342,218
- Issue date May 24, 2022
- Micron Technology, Inc.
- Si-Woo Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact patterning
- Patent number 11,152,375
- Issue date Oct 19, 2021
- Micron Technology, Inc.
- Byung Yoon Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Feedback controller in probe microscope utilizing a switch and a in...
- Patent number 9,140,720
- Issue date Sep 22, 2015
- Boise State University
- Byung I. Kim
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System and method for high-speed atomic force microscopy with switc...
- Patent number 9,091,705
- Issue date Jul 28, 2015
- Boise State University
- Byung I. Kim
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever-based optical fiber probe interfacial force microscope f...
- Patent number 8,549,660
- Issue date Oct 1, 2013
- Boise State University
- Byung Kim
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
VERTICAL CONTACTS FOR SEMICONDUCTOR DEVICES
- Publication number 20240373624
- Publication date Nov 7, 2024
- Micron Technology, Inc.
- Byung Yoon Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-ALIGNED LINE CONTACTS
- Publication number 20240292607
- Publication date Aug 29, 2024
- Micron Technology, Inc.
- Jun Ho Lee
Information Patent Application
Memory Circuitry And Methods Used In Forming Memory Circuitry
- Publication number 20240260251
- Publication date Aug 1, 2024
- Micron Technology, Inc.
- Dong Wan Kim
Information Patent Application
SINGLE CRYSTALLINE SILICON STACK FORMATION AND BONDING TO A CMOS WAFER
- Publication number 20240153813
- Publication date May 9, 2024
- Micron Technology, Inc.
- Si-Woo Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONDUCTIVE LINE CONTACT REGIONS HAVING MULTIPLE MULTI-DIRECTION CON...
- Publication number 20240147693
- Publication date May 2, 2024
- Micron Technology, Inc.
- Byung Yoon Kim
- G11 - INFORMATION STORAGE
Information Patent Application
RECESS GATE TRANSISTOR AND METHOD
- Publication number 20240079474
- Publication date Mar 7, 2024
- Micron Technology, Inc.
- Kyuseok Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL GATE MEMORY DEVICE AND METHOD
- Publication number 20230328966
- Publication date Oct 12, 2023
- Micron Technology, Inc.
- Hyucksoo Yang
- G11 - INFORMATION STORAGE
Information Patent Application
VERTICAL CONTACTS FOR SEMICONDUCTOR DEVICES
- Publication number 20230240067
- Publication date Jul 27, 2023
- Micron Technology, Inc.
- Byung Yoon Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FINFETS HAVING VARIOUS DIFFERENT THICKNESSES OF GATE OXIDES AND REL...
- Publication number 20230141716
- Publication date May 11, 2023
- Micron Technology, Inc.
- Hyuck Soo Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BURIED CONNECTION LINE FOR PERIPHERAL AREA
- Publication number 20230135653
- Publication date May 4, 2023
- Micron Technology, Inc.
- Kyuseok Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VERTICAL CONTACTS FOR SEMICONDUCTOR DEVICES
- Publication number 20220285365
- Publication date Sep 8, 2022
- Micron Technology, Inc.
- Byung Yoon Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE CRYSTALLINE SILICON STACK FORMATION AND BONDING TO A CMOS WAFER
- Publication number 20220277987
- Publication date Sep 1, 2022
- Micron Technology, Inc.
- Si-Woo Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACTS FOR TWISTED CONDUCTIVE LINES WITHIN MEMORY ARRAYS
- Publication number 20220246525
- Publication date Aug 4, 2022
- Micron Technology, Inc.
- Byung Yoon Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE CRYSTALLINE SILICON STACK FORMATION AND BONDING TO A CMOS WAFER
- Publication number 20220139767
- Publication date May 5, 2022
- Micron Technology, Inc.
- Si-Woo Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-DIRECTION CONDUCTIVE LINE AND STAIRCASE CONTACT FOR SEMICONDU...
- Publication number 20220108987
- Publication date Apr 7, 2022
- Micron Technology, Inc.
- Si-Woo Lee
- G11 - INFORMATION STORAGE
Information Patent Application
CONDUCTIVE LINE CONTACT REGIONS HAVING MULTIPLE MULTI-DIRECTION CON...
- Publication number 20220108988
- Publication date Apr 7, 2022
- Micron Technology, Inc.
- Byung Yoon Kim
- G11 - INFORMATION STORAGE
Information Patent Application
CONTACT PATTERNING
- Publication number 20200243540
- Publication date Jul 30, 2020
- Micron Technology, Inc.
- Byung Yoon Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR HIGH-SPEED ATOMIC FORCE MICROSCOPY
- Publication number 20130312142
- Publication date Nov 21, 2013
- BOISE STATE UNIVERSITY
- Byung I. Kim
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEM AND METHOD FOR IMAGING SOFT MATERIALS
- Publication number 20130298294
- Publication date Nov 7, 2013
- Byung I. Kim
- B82 - NANO-TECHNOLOGY
Information Patent Application
CANTILEVER-BASED OPTICAL INTERFACE FORCE MICROSCOPE
- Publication number 20120047610
- Publication date Feb 23, 2012
- Boise State University
- Byung I. Kim
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER-BASED OPTICAL INTERFACIAL FORCE MICROSCOPE
- Publication number 20110252512
- Publication date Oct 13, 2011
- Byung Kim
- G01 - MEASURING TESTING

Byung I. Kim

Person

Patents Grantslast 30 patents

Single crystalline silicon stack formation and bonding to a cmos wafer

Apparatuses including Finfets having different gate oxide configura...

Buried connection line for peripheral area of a memory device

Vertical contacts for semiconductor devices

Conductive line contact regions having multiple multi-direction con...

Single crystalline silicon stack formation and bonding to a CMOS wafer

Contacts for twisted conductive lines within memory arrays

Multi-direction conductive line and staircase contact for semicondu...

Vertical contacts for semiconductor devices

Single crystalline silicon stack formation and bonding to a CMOS wafer

Contact patterning

Feedback controller in probe microscope utilizing a switch and a in...

System and method for high-speed atomic force microscopy with switc...

Cantilever-based optical fiber probe interfacial force microscope f...

Patents Applicationslast 30 patents

VERTICAL CONTACTS FOR SEMICONDUCTOR DEVICES

SELF-ALIGNED LINE CONTACTS

Memory Circuitry And Methods Used In Forming Memory Circuitry

SINGLE CRYSTALLINE SILICON STACK FORMATION AND BONDING TO A CMOS WAFER

CONDUCTIVE LINE CONTACT REGIONS HAVING MULTIPLE MULTI-DIRECTION CON...

RECESS GATE TRANSISTOR AND METHOD

METAL GATE MEMORY DEVICE AND METHOD

VERTICAL CONTACTS FOR SEMICONDUCTOR DEVICES

FINFETS HAVING VARIOUS DIFFERENT THICKNESSES OF GATE OXIDES AND REL...

BURIED CONNECTION LINE FOR PERIPHERAL AREA

VERTICAL CONTACTS FOR SEMICONDUCTOR DEVICES

SINGLE CRYSTALLINE SILICON STACK FORMATION AND BONDING TO A CMOS WAFER

CONTACTS FOR TWISTED CONDUCTIVE LINES WITHIN MEMORY ARRAYS

SINGLE CRYSTALLINE SILICON STACK FORMATION AND BONDING TO A CMOS WAFER

MULTI-DIRECTION CONDUCTIVE LINE AND STAIRCASE CONTACT FOR SEMICONDU...

CONDUCTIVE LINE CONTACT REGIONS HAVING MULTIPLE MULTI-DIRECTION CON...

CONTACT PATTERNING

SYSTEM AND METHOD FOR HIGH-SPEED ATOMIC FORCE MICROSCOPY

SYSTEM AND METHOD FOR IMAGING SOFT MATERIALS

CANTILEVER-BASED OPTICAL INTERFACE FORCE MICROSCOPE

CANTILEVER-BASED OPTICAL INTERFACIAL FORCE MICROSCOPE