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Byungwook Cho
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Hwaseong-si, KR
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and method for channel equalization based on error detection
Patent number
11,711,245
Issue date
Jul 25, 2023
Samsung Electronics Co., Ltd.
Youngseob Suh
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Eye opening measurement circuit calculating difference between sigm...
Patent number
10,809,297
Issue date
Oct 20, 2020
Samsung Electronics Co., Ltd.
June-Hee Lee
G01 - MEASURING TESTING
Information
Patent Grant
Electronic devices including equalizers operating based on coeffici...
Patent number
10,728,061
Issue date
Jul 28, 2020
Samsung Electronics Co., Ltd.
June-Hee Lee
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Eye opening measurement circuit calculating difference between sigm...
Patent number
10,466,301
Issue date
Nov 5, 2019
Samsung Electronics Co., Ltd.
June-Hee Lee
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
RECEIVING DEVICE AND OPERATING METHOD THEREOF
Publication number
20240259176
Publication date
Aug 1, 2024
Samsung Electronics Co., Ltd.
Byungwook CHO
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
APPARATUS AND METHOD FOR CHANNEL EQUALIZATION BASED ON ERROR DETECTION
Publication number
20220086028
Publication date
Mar 17, 2022
Research & Business Foundation Sungkyunkwan University
Youngseob Suh
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
EYE OPENING MEASUREMENT CIRCUIT CALCULATING DIFFERENCE BETWEEN SIGM...
Publication number
20200064401
Publication date
Feb 27, 2020
Samsung Electronics Co., Ltd.
June-Hee LEE
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICES INCLUDING EQUALIZERS OPERATING BASED ON COEFFICI...
Publication number
20190386859
Publication date
Dec 19, 2019
Samsung Electronics Co., Ltd.
June-Hee LEE
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
EYE OPENING MEASUREMENT CIRCUIT CALCULATING DIFFERENCE BETWEEN SIGM...
Publication number
20190353704
Publication date
Nov 21, 2019
Samsung Electronics Co., Ltd.
June-Hee LEE
G01 - MEASURING TESTING