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C. Christopher Reed
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El Segundo, CA, US
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Patents Grants
last 30 patents
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Patent Grant
System and method for detecting defects
Patent number
8,466,687
Issue date
Jun 18, 2013
The Aerospace Corporation
C. Christopher Reed
G01 - MEASURING TESTING
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Patent Grant
Computer-implemented systems and methods for detecting electrostati...
Patent number
8,370,091
Issue date
Feb 5, 2013
The Aerospace Corporation
C. Christopher Reed
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Computer-implemented systems and methods for detecting electrostati...
Publication number
20120072139
Publication date
Mar 22, 2012
C. Christopher Reed
G01 - MEASURING TESTING
Information
Patent Application
System and method for detecting defects
Publication number
20120068716
Publication date
Mar 22, 2012
C. Christopher Reed
G01 - MEASURING TESTING