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C. Patrick Doherty
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Boise, ID, US
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Patents Grants
last 30 patents
Information
Patent Grant
Probe card for semiconductor wafers having mounting plate and socket
Patent number
7,250,780
Issue date
Jul 31, 2007
Micron Technology, Inc.
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Grant
Method and system having switching network for testing semiconducto...
Patent number
6,853,211
Issue date
Feb 8, 2005
Micron Technology, Inc.
C. Patrick Doherty
G01 - MEASURING TESTING
Information
Patent Grant
Method for testing semiconductor wafers
Patent number
6,798,224
Issue date
Sep 28, 2004
Micron Technology, Inc.
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Grant
Method and system having switching network for testing semiconducto...
Patent number
6,677,776
Issue date
Jan 13, 2004
Micron Technology, Inc.
C. Patrick Doherty
G01 - MEASURING TESTING
Information
Patent Grant
System for testing bumped semiconductor components with on-board mu...
Patent number
6,466,047
Issue date
Oct 15, 2002
Micron Technology, Inc.
C. Patrick Doherty
G01 - MEASURING TESTING
Information
Patent Grant
Interconnect and system for testing bumped semiconductor components...
Patent number
6,433,574
Issue date
Aug 13, 2002
Micron Technology, Inc.
C. Patrick Doherty
G01 - MEASURING TESTING
Information
Patent Grant
Probe card having on-board multiplex circuitry for expanding tester...
Patent number
6,366,112
Issue date
Apr 2, 2002
Micron Technology, Inc.
C. Patrick Doherty
G01 - MEASURING TESTING
Information
Patent Grant
Probe card and test system for semiconductor wafers
Patent number
6,359,456
Issue date
Mar 19, 2002
Micron Technology, Inc.
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Grant
Probe card, test method and test system for semiconductor wafers
Patent number
6,356,098
Issue date
Mar 12, 2002
Micron Technology, Inc.
Salman Akram
G01 - MEASURING TESTING
Information
Patent Grant
Interconnect and system for testing bumped semiconductor components...
Patent number
6,337,577
Issue date
Jan 8, 2002
Micron Technology, Inc.
C. Patrick Doherty
G01 - MEASURING TESTING
Information
Patent Grant
Wafer test method with probe card having on-board multiplex circuit...
Patent number
6,300,786
Issue date
Oct 9, 2001
Micron Technology, Inc.
C. Patrick Doherty
G01 - MEASURING TESTING
Information
Patent Grant
Probe card and testing method for semiconductor wafers
Patent number
6,275,052
Issue date
Aug 14, 2001
Micron Technology, Inc.
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Grant
Probe card, test method and test system for semiconductor wafers
Patent number
6,246,245
Issue date
Jun 12, 2001
Micron Technology, Inc.
Salman Akram
G01 - MEASURING TESTING
Information
Patent Grant
Probe card having on-board multiplex circuitry for expanding tester...
Patent number
6,246,250
Issue date
Jun 12, 2001
Micron Technology, Inc.
C. Patrick Doherty
G01 - MEASURING TESTING
Information
Patent Grant
Probe card for semiconductor wafers and method and system for testi...
Patent number
6,060,891
Issue date
May 9, 2000
Micron Technology, Inc.
David R. Hembree
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Methods, devices, and systems for selectable repair of imaging devices
Publication number
20070291145
Publication date
Dec 20, 2007
C. Patrick Doherty
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Probe card for semiconductor wafers and method and system for testi...
Publication number
20040132222
Publication date
Jul 8, 2004
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Application
Method and system having switching network for testing semiconducto...
Publication number
20040021480
Publication date
Feb 5, 2004
C. Patrick Doherty
G01 - MEASURING TESTING
Information
Patent Application
Method and system having switching network for testing semiconducto...
Publication number
20020196047
Publication date
Dec 26, 2002
C. Patrick Doherty
G01 - MEASURING TESTING