Calvin K. Choi

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Contact probe utilizing conductive meltable probing material
- Patent number 5,585,736
- Issue date Dec 17, 1996
- Hshieh; Fwu-Iuan
- Fwu-Iuan Hshieh
- G01 - MEASURING TESTING
Information Patent Grant
Reliability test method for semiconductor trench devices
- Patent number 5,486,772
- Issue date Jan 23, 1996
- Siliconix Incorporation
- Fwu-Iuan Hshieh
- G01 - MEASURING TESTING