Cam L. Lu

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Automatic generating of timing constraints for the validation/signo...
- Patent number 7,490,307
- Issue date Feb 10, 2009
- LSI Corporation
- Giuseppe Fomaciari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test clocking scheme
- Patent number 7,444,560
- Issue date Oct 28, 2008
- LSI Corporation
- Thai M. Nguyen
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of generating an efficient stuck-at fault and transition del...
- Patent number 7,058,909
- Issue date Jun 6, 2006
- LSI Logic Corporation
- Cam L. Lu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCAN TEST CIRCUITRY COMPRISING SCAN CELLS WITH FUNCTIONAL OUTPUT MU...
- Publication number 20130111285
- Publication date May 2, 2013
- LSI Corporation
- Sreejit Chakravarty
- G01 - MEASURING TESTING
Information Patent Application
Automatic generation of timing constraints for the validation/signo...
- Publication number 20080005710
- Publication date Jan 3, 2008
- LSI Logic Corporation
- Giuseppe Fomaciari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Test clocking scheme
- Publication number 20060095816
- Publication date May 4, 2006
- Thai M. Nguyen
- G01 - MEASURING TESTING
Information Patent Application
Method of generating an efficient stuck-at fault and transition del...
- Publication number 20050125755
- Publication date Jun 9, 2005
- Cam L. Lu
- G01 - MEASURING TESTING