Canglong Tang

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Electrical test probe and testing system using the same
- Patent number 11,119,119
- Issue date Sep 14, 2021
- Telefonaktiebolaget LM Ericsson (publ)
- Jun Huang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Electrical Test Probe and Testing System using the Same
- Publication number 20200300891
- Publication date Sep 24, 2020
- Jun Huang
- G01 - MEASURING TESTING