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Carl Barnhart
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Austin, TX, US
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last 30 patents
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Patent Grant
Distributed test compression for integrated circuits
Patent number
7,979,764
Issue date
Jul 12, 2011
Cadence Design Systems, Inc.
Brian Foutz
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
DISTRIBUTED TEST COMPRESSION FOR INTEGRATED CIRCUITS
Publication number
20090119559
Publication date
May 7, 2009
Cadence Design Systems, Inc.
Brian Foutz
G06 - COMPUTING CALCULATING COUNTING