Carl E. Hess

Person

Los Altos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for inspection of wafers and reticles using des...
- Patent number 11,348,222
- Issue date May 31, 2022
- KLA-Tencor Technologies Corp.
- Paul Frank Marella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for inspection of wafers and reticles using des...
- Patent number 10,713,771
- Issue date Jul 14, 2020
- KLA-Tencor Technologies Corp.
- Paul Frank Marella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection of photomasks by comparing two photomasks
- Patent number 10,451,563
- Issue date Oct 22, 2019
- KLA-Tencor Corporation
- Weston L. Sousa
- G01 - MEASURING TESTING
Information Patent Grant
Time-varying intensity map generation for reticles
- Patent number 10,401,305
- Issue date Sep 3, 2019
- KLA-Tencor Corporation
- Carl E. Hess
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Delta die and delta database inspection
- Patent number 9,778,205
- Issue date Oct 3, 2017
- KLA-Tencor Corporation
- Carl E. Hess
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for detecting design and process defects on a waf...
- Patent number 9,710,903
- Issue date Jul 18, 2017
- KLA-Tencor Corp.
- Christophe Fouquet
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Using reflected and transmission maps to detect reticle degradation
- Patent number 9,417,191
- Issue date Aug 16, 2016
- KLA-Tencor Corporation
- Carl E. Hess
- G01 - MEASURING TESTING
Information Patent Grant
Delta die intensity map measurement
- Patent number 9,390,494
- Issue date Jul 12, 2016
- KLA-Tencor Corporation
- Carl E. Hess
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for hybrid reticle inspection
- Patent number 9,208,552
- Issue date Dec 8, 2015
- KLA-Tencor Corporation
- Carl Hess
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for inspection of wafers and reticles using des...
- Patent number 9,002,497
- Issue date Apr 7, 2015
- KLA-Tencor Technologies Corp.
- William Volk
- G01 - MEASURING TESTING
Information Patent Grant
Database-driven cell-to-cell reticle inspection
- Patent number 8,914,754
- Issue date Dec 16, 2014
- KLA-Tencor Corporation
- Carl Hess
- G01 - MEASURING TESTING
Information Patent Grant
Focus offset contamination inspection
- Patent number 8,810,646
- Issue date Aug 19, 2014
- KLA-Tencor Corporation
- Carl Hess
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for classifying defects detected on a reticle
- Patent number 8,204,297
- Issue date Jun 19, 2012
- KLA-Tencor Corp.
- Yalin Xiong
- G01 - MEASURING TESTING
Information Patent Grant
Defect classification
- Patent number 8,165,384
- Issue date Apr 24, 2012
- KLA-Tencor Corporation
- Weimin Ma
- G01 - MEASURING TESTING
Information Patent Grant
Methods for simulating reticle layout data, inspecting reticle layo...
- Patent number 8,151,220
- Issue date Apr 3, 2012
- KLA-Tencor Technologies Corp.
- Carl Hess
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Computer-implemented methods and systems for determining different...
- Patent number 8,102,408
- Issue date Jan 24, 2012
- KLA-Tencor Technologies Corp.
- Gaurav Verma
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for detection of oversized sub-resolution assist features
- Patent number 7,995,199
- Issue date Aug 9, 2011
- KLA-Tencor Corporation
- Carl E. Hess
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Feature identification for metrological analysis
- Patent number 7,932,004
- Issue date Apr 26, 2011
- KLA-Tencor Corporation
- Yalin Xiong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Blade server interconnection
- Patent number 7,734,711
- Issue date Jun 8, 2010
- KLA-Tencor Corporation
- Joseph M. Blecher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer-implemented methods for detecting defects in reticle desig...
- Patent number 7,646,906
- Issue date Jan 12, 2010
- KLA-Tencor Technologies Corp.
- Zain K. Saidin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process window optical proximity correction
- Patent number 7,493,590
- Issue date Feb 17, 2009
- KLA-Tencor Technologies Corporation
- Carl Hess
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
High bandwidth image transfer
- Patent number 7,379,847
- Issue date May 27, 2008
- KLA-Tencor Corporation
- Joseph M. Blecher
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...
- Publication number 20200074619
- Publication date Mar 5, 2020
- KLA-Tencor Technologies Corporation
- Paul Frank Marella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...
- Publication number 20180247403
- Publication date Aug 30, 2018
- KLA-Tencor Technologies Corporation
- Paul Frank Marella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DELTA DIE AND DELTA DATABASE INSPECTION
- Publication number 20150276617
- Publication date Oct 1, 2015
- KLA-Tencor Corporation
- Carl E. Hess
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Inspection of Wafers and Reticles Using Des...
- Publication number 20150178914
- Publication date Jun 25, 2015
- KLA-Tencor Technologies Corporation
- Paul Frank Marella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
USING REFLECTED AND TRANSMISSION MAPS TO DETECT RETICLE DEGRADATION
- Publication number 20150103351
- Publication date Apr 16, 2015
- KLA-Tencor Corporation
- Carl E. Hess
- G01 - MEASURING TESTING
Information Patent Application
DELTA DIE INTENSITY MAP MEASUREMENT
- Publication number 20140168418
- Publication date Jun 19, 2014
- KLA-Tencor Corporation
- Carl E. Hess
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Hybrid Reticle Inspection
- Publication number 20130279792
- Publication date Oct 24, 2013
- KLA-Tencor Corporation
- Carl Hess
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TIME-VARYING INTENSITY MAP GENERATION FOR RETICLES
- Publication number 20130211736
- Publication date Aug 15, 2013
- KLA-Tencor Corporation
- Carl E. Hess
- G01 - MEASURING TESTING
Information Patent Application
Database-Driven Cell-to-Cell Reticle Inspection
- Publication number 20130111417
- Publication date May 2, 2013
- KLA-TENCOR CORPORATION
- Carl Hess
- G01 - MEASURING TESTING
Information Patent Application
FOCUS OFFSET CONTAMINATION INSPECTION
- Publication number 20120086799
- Publication date Apr 12, 2012
- KLA-Tencor Corporation
- Carl Hess
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING DESIGN AND PROCESS DEFECTS ON A W...
- Publication number 20110276935
- Publication date Nov 10, 2011
- KLA-Tencor Corporation
- Christophe Fouquet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Detection of Oversized Sub-Resolution Assist Features
- Publication number 20090310136
- Publication date Dec 17, 2009
- KLA-Tencor Corporation
- Carl E. Hess
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...
- Publication number 20080081385
- Publication date Apr 3, 2008
- Paul Frank Marella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTER-IMPLEMENTED METHODS AND SYSTEMS FOR DETERMINING DIFFERENT...
- Publication number 20080072207
- Publication date Mar 20, 2008
- Gaurav Verma
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Computer-implemented methods for detecting defects in reticle desig...
- Publication number 20060236294
- Publication date Oct 19, 2006
- Zain K. Saidin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Computer-implemented methods, processors, and systems for creating...
- Publication number 20060161452
- Publication date Jul 20, 2006
- KLA-Tencor Technologies Corp.
- Carl Hess
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods for simulating reticle layout data, inspecting reticle layo...
- Publication number 20060051682
- Publication date Mar 9, 2006
- Carl Hess
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods and systems for inspection of wafers and reticles using des...
- Publication number 20050004774
- Publication date Jan 6, 2005
- William Volk
- G06 - COMPUTING CALCULATING COUNTING

Carl E. Hess

Person

Patents Grantslast 30 patents

Methods and systems for inspection of wafers and reticles using des...

Methods and systems for inspection of wafers and reticles using des...

Inspection of photomasks by comparing two photomasks

Time-varying intensity map generation for reticles

Delta die and delta database inspection

System and method for detecting design and process defects on a waf...

Using reflected and transmission maps to detect reticle degradation

Delta die intensity map measurement

Method and system for hybrid reticle inspection

Methods and systems for inspection of wafers and reticles using des...

Database-driven cell-to-cell reticle inspection

Focus offset contamination inspection

Methods and systems for classifying defects detected on a reticle

Defect classification

Methods for simulating reticle layout data, inspecting reticle layo...

Computer-implemented methods and systems for determining different...

Method for detection of oversized sub-resolution assist features

Feature identification for metrological analysis

Blade server interconnection

Computer-implemented methods for detecting defects in reticle desig...

Process window optical proximity correction

High bandwidth image transfer

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...

METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...

DELTA DIE AND DELTA DATABASE INSPECTION

Methods and Systems for Inspection of Wafers and Reticles Using Des...

USING REFLECTED AND TRANSMISSION MAPS TO DETECT RETICLE DEGRADATION

DELTA DIE INTENSITY MAP MEASUREMENT

Method and System for Hybrid Reticle Inspection

TIME-VARYING INTENSITY MAP GENERATION FOR RETICLES

Database-Driven Cell-to-Cell Reticle Inspection

FOCUS OFFSET CONTAMINATION INSPECTION

SYSTEMS AND METHODS FOR DETECTING DESIGN AND PROCESS DEFECTS ON A W...

Method for Detection of Oversized Sub-Resolution Assist Features

METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...

COMPUTER-IMPLEMENTED METHODS AND SYSTEMS FOR DETERMINING DIFFERENT...

Computer-implemented methods for detecting defects in reticle desig...

Computer-implemented methods, processors, and systems for creating...

Methods for simulating reticle layout data, inspecting reticle layo...

Methods and systems for inspection of wafers and reticles using des...