Carl F. Barnhart

Person

Ojai, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Partial good integrated circuit and method of testing same
- Patent number 7,478,301
- Issue date Jan 13, 2009
- International Business Machines Corporation
- Leonard O. Farnsworth, III
- G11 - INFORMATION STORAGE
Information Patent Grant
Partial good integrated circuit and method of testing same
- Patent number 7,434,129
- Issue date Oct 7, 2008
- International Business Machines Corporation
- Leonard O. Farnsworth, III
- G11 - INFORMATION STORAGE
Information Patent Grant
Partial good integrated circuit and method of testing same
- Patent number 7,305,600
- Issue date Dec 4, 2007
- International Business Machines Corporation
- Leonard O. Farnsworth, III
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing integrated logic circuits
- Patent number 6,804,803
- Issue date Oct 12, 2004
- International Business Machines Corporation
- Carl F. Barnhart
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing regularly structured logic circuits in integrated circuit d...
- Patent number 6,795,944
- Issue date Sep 21, 2004
- International Business Machines Corporation
- Carl F. Barnhart
- G11 - INFORMATION STORAGE
Information Patent Grant
Real-time decoder for scan test patterns
- Patent number 6,611,933
- Issue date Aug 26, 2003
- International Business Machines Corporation
- Bernd Koenemann
- G01 - MEASURING TESTING
Information Patent Grant
D flip-flop structure with flush path for high-speed boundary scan...
- Patent number 6,567,943
- Issue date May 20, 2003
- International Business Machines Corporation
- Carl Frederick Barnhart
- G01 - MEASURING TESTING
Information Patent Grant
High-performance IEEE1149.1-compliant boundary scan cell
- Patent number 6,185,710
- Issue date Feb 6, 2001
- International Business Machines Corporation
- Carl Frederick Barnhart
- G01 - MEASURING TESTING
Information Patent Grant
Performing arithmetic using indirect digital-to-analog conversion
- Patent number 4,205,303
- Issue date May 27, 1980
- International Business Machines Corporation
- Carl F. Barnhart
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PARTIAL GOOD INTEGRATED CIRCUIT AND METHOD OF TESTING SAME
- Publication number 20080209289
- Publication date Aug 28, 2008
- Leonard O. Farnsworth
- G01 - MEASURING TESTING
Information Patent Application
PARTIAL GOOD INTEGRATED CIRCUIT AND METHOD OF TESTING SAME
- Publication number 20080010571
- Publication date Jan 10, 2008
- Leonard O. Farnsworth
- G01 - MEASURING TESTING
Information Patent Application
Partial good integrated circuit and method of testing same
- Publication number 20050047224
- Publication date Mar 3, 2005
- International Business Machines Corporation
- Leonard O. Farnsworth
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR COMPACT SCAN TESTING
- Publication number 20040139377
- Publication date Jul 15, 2004
- International Business Machines Corporation
- Carl F. Barnhart
- G01 - MEASURING TESTING
Information Patent Application
Testing regularly structured logic circuits in integrated circuit d...
- Publication number 20020170009
- Publication date Nov 14, 2002
- International Business Machines Corporation
- Carl F. Barnhart
- G01 - MEASURING TESTING
Information Patent Application
Method for testing integrated logic circuits
- Publication number 20020147559
- Publication date Oct 10, 2002
- Carl F. Barnhart
- G06 - COMPUTING CALCULATING COUNTING

Carl F. Barnhart

Person

Patents Grantslast 30 patents

Partial good integrated circuit and method of testing same

Partial good integrated circuit and method of testing same

Partial good integrated circuit and method of testing same

Method for testing integrated logic circuits

Testing regularly structured logic circuits in integrated circuit d...

Real-time decoder for scan test patterns

D flip-flop structure with flush path for high-speed boundary scan...

High-performance IEEE1149.1-compliant boundary scan cell

Performing arithmetic using indirect digital-to-analog conversion

Patents Applicationslast 30 patents

PARTIAL GOOD INTEGRATED CIRCUIT AND METHOD OF TESTING SAME

PARTIAL GOOD INTEGRATED CIRCUIT AND METHOD OF TESTING SAME

Partial good integrated circuit and method of testing same

METHOD AND APPARATUS FOR COMPACT SCAN TESTING

Testing regularly structured logic circuits in integrated circuit d...

Method for testing integrated logic circuits