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Carl H. Fong
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San Jose, CA, US
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last 30 patents
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Patent Grant
Multi-purpose bond pad test die
Patent number
5,153,507
Issue date
Oct 6, 1992
VLSI Technology, Inc.
Carl H. Fong
G01 - MEASURING TESTING
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Patent Grant
System for detecting and correcting misalignment of semiconductor p...
Patent number
5,061,895
Issue date
Oct 29, 1991
VLSI Technology, Inc.
Carl H. Fong
G01 - MEASURING TESTING