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Carl Johannes Schlockermann
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Puchheim, DE
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last 30 patents
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Patent Grant
Atomic force microscope
Patent number
7,111,504
Issue date
Sep 26, 2006
Lucent Technologies Inc.
Girsh Blumberg
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Atomic force microscope
Publication number
20060065047
Publication date
Mar 30, 2006
Girsh Blumberg
G01 - MEASURING TESTING