Carl L. Ostrowski

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Milford, MI, US

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Patents Grantslast 30 patents

Information Patent Grant
Thermal control wafer with integrated heating-sensing elements
- Patent number 12,085,609
- Issue date Sep 10, 2024
- AEM SINGAPORE PTE. LTD.
- Carl L. Ostrowski
- G01 - MEASURING TESTING
Information Patent Grant
Integrated heater and temperature measurement
- Patent number 12,061,227
- Issue date Aug 13, 2024
- AEM SINGAPORE PTE. LTD.
- Carl L. Ostrowski
- G01 - MEASURING TESTING
Information Patent Grant
Thermal control wafer with integrated heating-sensing elements
- Patent number 12,013,432
- Issue date Jun 18, 2024
- AEM SINGAPORE PTE. LTD.
- Carl L. Ostrowski
- G01 - MEASURING TESTING
Information Patent Grant
Integrated heater and temperature measurement
- Patent number 11,828,796
- Issue date Nov 28, 2023
- AEM Holdings Ltd.
- Carl L. Ostrowski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED HEATER AND TEMPERATURE MEASUREMENT
- Publication number 20240369621
- Publication date Nov 7, 2024
- AEM SINGAPORE PTE. LTD.
- Carl L. OSTROWSKI
- G01 - MEASURING TESTING