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Carl Masser
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Santa Barbara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Scanning probe microscope having support stage incorporating a kine...
Patent number
8,782,810
Issue date
Jul 15, 2014
Bruker Nano, Inc.
Carl Masser
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope with compact scanner
Patent number
8,474,060
Issue date
Jun 25, 2013
Bruker Nano, Inc.
Nghi Phan
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Apparatus and method of amplifying low voltage signals
Patent number
7,886,583
Issue date
Feb 15, 2011
Veeco Instruments Inc.
Carl Masser
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method and apparatus for monitoring of a SPM actuator
Patent number
7,631,546
Issue date
Dec 15, 2009
Veeco Instruments Inc.
Carl Masser
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Scanning probe microscope with compact scanner
Publication number
20120278957
Publication date
Nov 1, 2012
Bruker Nano, Inc.
Nghi Phan
G01 - MEASURING TESTING
Information
Patent Application
SCANNING PROBE MICROSCOPE HAVING SUPPORT STAGE INCORPORATING A KINE...
Publication number
20110107471
Publication date
May 5, 2011
Bruker Nano, Inc.
Carl Masser
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD OF AMPLIFYING LOW VOLTAGE SIGNALS
Publication number
20080011064
Publication date
Jan 17, 2008
Carl Masser
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for monitoring movement of a SPM actuator
Publication number
20080000291
Publication date
Jan 3, 2008
Veeco Instruments Inc.
Carl Masser
G01 - MEASURING TESTING