Carl Ross

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Mundelein, IL, US

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Patents Grantslast 30 patents

Information Patent Grant
Acceleration switch
- Patent number 7,009,124
- Issue date Mar 7, 2006
- Motorola, Inc.
- Shiuh-Hui Steven Chen
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Semiconductor wafer having a thin die and tethers and methods of ma...
- Patent number 6,881,648
- Issue date Apr 19, 2005
- Motorola, Inc.
- Shiuh-Hui Steven Chen
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer having a thin die and tethers and methods of ma...
- Patent number 6,608,370
- Issue date Aug 19, 2003
- Motorola, Inc.
- Shiuh-Hui Steven Chen
- G01 - MEASURING TESTING
Information Patent Grant
Selectable pressure sensor
- Patent number 6,142,021
- Issue date Nov 7, 2000
- Motorola, Inc.
- Carl Ross
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive pressure sensor and method of fabricating same
- Patent number 5,744,725
- Issue date Apr 28, 1998
- Motorola Inc.
- Shiuh-Hui Steven Chen
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive pressure sensor and method for making the same
- Patent number 5,600,072
- Issue date Feb 4, 1997
- Motorola, Inc.
- Shiuh-Hui S. Chen
- G01 - MEASURING TESTING
Information Patent Grant
Device with bonded conductive and insulating substrates and method...
- Patent number 5,365,790
- Issue date Nov 22, 1994
- Motorola, Inc.
- Shiuh-Hui Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ACCELERATION SWITCH
- Publication number 20050252755
- Publication date Nov 17, 2005
- Shiuh-Hui Steven Chen
- B60 - VEHICLES IN GENERAL
Information Patent Application
Semiconductor wafer having a thin die and tethers and methods of ma...
- Publication number 20030162322
- Publication date Aug 28, 2003
- Shiuh-Hui Steven Chen
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER HAVING A THIN DIE AND TETHERS AND METHODS OF MA...
- Publication number 20030141570
- Publication date Jul 31, 2003
- Shiuh-Hui Steven Chen
- G01 - MEASURING TESTING