Carl Stephen Lester

Person

Clifton Park, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection system and method
- Patent number 11,199,494
- Issue date Dec 14, 2021
- General Electric Company
- Venkata Vijayaraghava Nalladega
- G01 - MEASURING TESTING
Information Patent Grant
Wireless transceiver and method for remote ultrasonic measurements
- Patent number 7,039,362
- Issue date May 2, 2006
- General Electric Company
- Robert John Filkins
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for internet enabled, wireless remote sensor m...
- Patent number 6,927,686
- Issue date Aug 9, 2005
- General Electric Company
- Edward James Nieters
- G08 - SIGNALLING
Information Patent Grant
System and method for monitoring defects in structures
- Patent number 6,922,641
- Issue date Jul 26, 2005
- General Electric Company
- Thomas Batzinger
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed eddy current sensor probes and inspection methods
- Patent number 6,911,826
- Issue date Jun 28, 2005
- General Electric Company
- Yuri Alexeyevich Plotnikov
- G01 - MEASURING TESTING
Information Patent Grant
Self reference eddy current probe, measurement system, and measurem...
- Patent number 6,670,808
- Issue date Dec 30, 2003
- General Electric Company
- Shridhar Champaknath Nath
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20210096065
- Publication date Apr 1, 2021
- GENERAL ELECTRIC COMPANY
- Venkata Vijayaraghava Nalladega
- G01 - MEASURING TESTING
Information Patent Application
ELECTROCHEMICAL MACHINING TOOL ASSEMBLY
- Publication number 20070175751
- Publication date Aug 2, 2007
- GENERAL ELECTRIC COMPANY
- Thomas James Batzinger
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Electrochemical machining method, tool assembly, and monitoring method
- Publication number 20050098445
- Publication date May 12, 2005
- General Electric Company
- Thomas James Batzinger
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
System and method for monitoring defects in structures
- Publication number 20050075800
- Publication date Apr 7, 2005
- Thomas Batzinger
- G01 - MEASURING TESTING
Information Patent Application
Pulsed eddy current sensor probes and inspection methods
- Publication number 20040245997
- Publication date Dec 9, 2004
- Yuri Alexeyevich Plotnikov
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for internet enabled, wireless remote sensor m...
- Publication number 20040113773
- Publication date Jun 17, 2004
- GENERAL ELECTRIC COMPANY
- Edward James Nieters
- G08 - SIGNALLING
Information Patent Application
Wireless transceiver and method for remote ultrasonic measurements
- Publication number 20030060163
- Publication date Mar 27, 2003
- Robert John Filkins
- G01 - MEASURING TESTING
Information Patent Application
Self reference eddy current probe, measurement system, and measurem...
- Publication number 20030038628
- Publication date Feb 27, 2003
- Shridhar Champaknath Nath
- G01 - MEASURING TESTING

Carl Stephen Lester

Person

Patents Grantslast 30 patents

Inspection system and method

Wireless transceiver and method for remote ultrasonic measurements

Method and apparatus for internet enabled, wireless remote sensor m...

System and method for monitoring defects in structures

Pulsed eddy current sensor probes and inspection methods

Self reference eddy current probe, measurement system, and measurem...

Patents Applicationslast 30 patents

INSPECTION SYSTEM AND METHOD

ELECTROCHEMICAL MACHINING TOOL ASSEMBLY

Electrochemical machining method, tool assembly, and monitoring method

System and method for monitoring defects in structures

Pulsed eddy current sensor probes and inspection methods

Method and apparatus for internet enabled, wireless remote sensor m...

Wireless transceiver and method for remote ultrasonic measurements

Self reference eddy current probe, measurement system, and measurem...