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last 30 patents
Information
Patent Grant
Apparatus, method and computer program product for defect detection...
Patent number
11,892,493
Issue date
Feb 6, 2024
KLA Corporation
Tom Marivoet
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus, method and computer program product for defect detection...
Patent number
11,726,126
Issue date
Aug 15, 2023
KLA Corporation
Tom Marivoet
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus, method and computer program product for defect detection...
Patent number
11,105,839
Issue date
Aug 31, 2021
KLA Corporation
Tom Marivoet
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus, method and computer program product for defect detection...
Patent number
10,935,503
Issue date
Mar 2, 2021
KLA Corporation
Tom Marivoet
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus, method and computer program product for defect detection...
Patent number
10,324,044
Issue date
Jun 18, 2019
KLA-Tencor Corporation
Tom Marivoet
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus, method and computer program product for inspection of at...
Patent number
10,190,994
Issue date
Jan 29, 2019
KLA-Tencor Corporation
Carl Truyens
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and arrangement for positioning electronic devices into comp...
Patent number
8,903,541
Issue date
Dec 2, 2014
KLA-Tencor Corporation
Bert Vangilbergen
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Device for transferring electronic components from an inclined supp...
Patent number
7,222,720
Issue date
May 29, 2007
Icos Vision Systems, naamloze vennootschap
Carl Truyens
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
Publication number
20230393185
Publication date
Dec 7, 2023
KLA Corporation
Tom Marivoet
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
Publication number
20220099725
Publication date
Mar 31, 2022
Tom Marivoet
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
Publication number
20210048396
Publication date
Feb 18, 2021
Tom Marivoet
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
Publication number
20210018450
Publication date
Jan 21, 2021
KLA Corporation
Tom Marivoet
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
Publication number
20190302033
Publication date
Oct 3, 2019
KLA-Tencor Corporation
Tom Marivoet
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR INSPECTION OF AT...
Publication number
20170003231
Publication date
Jan 5, 2017
KLA-Tencor Corporation
Carl Truyens
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
Publication number
20160313257
Publication date
Oct 27, 2016
KLA-Tencor Corporation
Tom Marivoet
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND ARRANGEMENT FOR POSITIONING ELECTRONIC DEVICES INTO COMP...
Publication number
20120197432
Publication date
Aug 2, 2012
KLA-Tencor Corporation
Bert Vangilbergen
G01 - MEASURING TESTING
Information
Patent Application
Device for transfering electronic components from an inclined suppl...
Publication number
20050163604
Publication date
Jul 28, 2005
Carl Truyens
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR