Carl V. Reynolds

Person

Pleasanton, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probing apparatus with guarded signal traces
- Patent number 8,203,351
- Issue date Jun 19, 2012
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly with an interchangeable probe insert
- Patent number 7,898,242
- Issue date Mar 1, 2011
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing devices
- Patent number 7,843,202
- Issue date Nov 30, 2010
- FormFactor, Inc.
- Eric D. Hobbs
- G01 - MEASURING TESTING
Information Patent Grant
Probing apparatus with guarded signal traces
- Patent number 7,724,004
- Issue date May 25, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level interposer
- Patent number 7,649,368
- Issue date Jan 19, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly with an interchangeable probe insert
- Patent number 7,498,825
- Issue date Mar 3, 2009
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for limiting over travel in a probe card assembly
- Patent number 7,482,822
- Issue date Jan 27, 2009
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Grant
Methods for making plated through holes usable as interconnection w...
- Patent number 7,479,792
- Issue date Jan 20, 2009
- FormFactor, Inc.
- Gaetan L. Mathieu
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level interposer
- Patent number 7,396,236
- Issue date Jul 8, 2008
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Method for making a socket to perform testing on integrated circuits
- Patent number 7,330,039
- Issue date Feb 12, 2008
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Grant
Probe card covering system and method
- Patent number 7,128,587
- Issue date Oct 31, 2006
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for limiting over travel in a probe card assembly
- Patent number 7,084,650
- Issue date Aug 1, 2006
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Grant
Method of making microelectronic spring contact array
- Patent number 7,047,638
- Issue date May 23, 2006
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Methods for making plated through holes usable as interconnection w...
- Patent number 7,024,763
- Issue date Apr 11, 2006
- FormFactor, Inc.
- Gaetan L. Mathieu
- G01 - MEASURING TESTING
Information Patent Grant
Probe card covering system and method
- Patent number 6,960,923
- Issue date Nov 1, 2005
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Method for making a socket to perform testing on integrated circuits
- Patent number 6,920,689
- Issue date Jul 26, 2005
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBING APPARATUS WITH GUARDED SIGNAL TRACES
- Publication number 20100225344
- Publication date Sep 9, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
WAFER LEVEL INTERPOSER
- Publication number 20100120267
- Publication date May 13, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD ASSEMBLY WITH AN INTERCHANGEABLE PROBE INSERT
- Publication number 20090160432
- Publication date Jun 25, 2009
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR LIMITING OVER TRAVEL IN A PROBE CARD ASSEMBLY
- Publication number 20090134897
- Publication date May 28, 2009
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Application
WAFER LEVEL INTERPOSER
- Publication number 20080265922
- Publication date Oct 30, 2008
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MAKING A SOCKET TO PERFORM TESTING ON INTEGRATED CIRCUITS...
- Publication number 20080132095
- Publication date Jun 5, 2008
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Application
PROBING APPARATUS WITH GUARDED SIGNAL TRACES
- Publication number 20070139061
- Publication date Jun 21, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Probe Card Assembly With An Interchangeable Probe Insert
- Publication number 20070007977
- Publication date Jan 11, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Apparatus And Method For Limiting Over Travel In A Probe Card Assembly
- Publication number 20060261827
- Publication date Nov 23, 2006
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Application
Method Of Making Microelectronic Spring Contact Array
- Publication number 20060191136
- Publication date Aug 31, 2006
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Methods for making plated through holes usable as interconnection w...
- Publication number 20060185164
- Publication date Aug 24, 2006
- FormFactor, Inc.
- Gaetan L. Mathieu
- G01 - MEASURING TESTING
Information Patent Application
Probe card covering system and method
- Publication number 20060057875
- Publication date Mar 16, 2006
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Method for making a socket to perform testing on integrated circuits
- Publication number 20050167816
- Publication date Aug 4, 2005
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Application
Methods for making vertical electric feed through structures usable...
- Publication number 20050108875
- Publication date May 26, 2005
- Gaetan L. Mathieu
- G01 - MEASURING TESTING
Information Patent Application
Methods for making plated through holes usable as interconnection w...
- Publication number 20050108876
- Publication date May 26, 2005
- Gaetan L. Mathieu
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for limiting over travel in a probe card assembly
- Publication number 20040113640
- Publication date Jun 17, 2004
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Application
Method for making a socket to perform testing on integrated circuit...
- Publication number 20040107568
- Publication date Jun 10, 2004
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Application
Method of making microelectronic spring contact array
- Publication number 20040016119
- Publication date Jan 29, 2004
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Probe card covering system and method
- Publication number 20030112001
- Publication date Jun 19, 2003
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Wafer level interposer
- Publication number 20020132501
- Publication date Sep 19, 2002
- Benjamin N. Eldridge
- G01 - MEASURING TESTING

Carl V. Reynolds

Person

Patents Grantslast 30 patents

Probing apparatus with guarded signal traces

Probe card assembly with an interchangeable probe insert

Apparatus for testing devices

Probing apparatus with guarded signal traces

Wafer level interposer

Probe card assembly with an interchangeable probe insert

Apparatus and method for limiting over travel in a probe card assembly

Methods for making plated through holes usable as interconnection w...

Wafer level interposer

Method for making a socket to perform testing on integrated circuits

Probe card covering system and method

Apparatus and method for limiting over travel in a probe card assembly

Method of making microelectronic spring contact array

Methods for making plated through holes usable as interconnection w...

Probe card covering system and method

Method for making a socket to perform testing on integrated circuits

Patents Applicationslast 30 patents

PROBING APPARATUS WITH GUARDED SIGNAL TRACES

WAFER LEVEL INTERPOSER

PROBE CARD ASSEMBLY WITH AN INTERCHANGEABLE PROBE INSERT

APPARATUS AND METHOD FOR LIMITING OVER TRAVEL IN A PROBE CARD ASSEMBLY

WAFER LEVEL INTERPOSER

METHOD OF MAKING A SOCKET TO PERFORM TESTING ON INTEGRATED CIRCUITS...

PROBING APPARATUS WITH GUARDED SIGNAL TRACES

Probe Card Assembly With An Interchangeable Probe Insert

Apparatus And Method For Limiting Over Travel In A Probe Card Assembly

Method Of Making Microelectronic Spring Contact Array

Methods for making plated through holes usable as interconnection w...

Probe card covering system and method

Method for making a socket to perform testing on integrated circuits

Methods for making vertical electric feed through structures usable...

Methods for making plated through holes usable as interconnection w...

Apparatus and method for limiting over travel in a probe card assembly

Method for making a socket to perform testing on integrated circuit...

Method of making microelectronic spring contact array

Probe card covering system and method

Wafer level interposer