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Carlo Alberto Romani
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Milano, IT
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system for magnetizing elements of a magnetic field sens...
Patent number
11,598,829
Issue date
Mar 7, 2023
Robert Bosch GmbH
Brad Engel
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor reading device, system and method
Patent number
10,473,731
Issue date
Nov 12, 2019
STMicroelectronics S.r.l.
Carlo Alberto Romani
G01 - MEASURING TESTING
Information
Patent Grant
Reading circuit with automatic offset compensation for a magnetic-f...
Patent number
10,001,530
Issue date
Jun 19, 2018
STMicroelectronics S.r.l.
Fabio Bottinelli
G01 - MEASURING TESTING
Information
Patent Grant
Switched-capacitor network with input-output common mode decoupling
Patent number
9,461,625
Issue date
Oct 4, 2016
Maxim Integrated Products, Inc.
Luciano Prandi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Reading circuit for a magnetic field sensor with sensititivy calibr...
Patent number
9,360,533
Issue date
Jun 7, 2016
STMicroelectronics S.r.l.
Carlo Alberto Romani
G01 - MEASURING TESTING
Information
Patent Grant
Biasing circuit for a magnetic field sensor, and corresponding bias...
Patent number
9,279,867
Issue date
Mar 8, 2016
STMicroelectronics S.r.l.
Enrico Pozzati
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Reading circuit for a magnetic field sensor with sensitivity calibr...
Patent number
9,151,806
Issue date
Oct 6, 2015
STMicroelectronics S.r.l.
Carlo Alberto Romani
G01 - MEASURING TESTING
Information
Patent Grant
Biasing circuit for a magnetic field sensor, and corresponding bias...
Patent number
9,018,941
Issue date
Apr 28, 2015
STMicroelectronics S.r.l.
Enrico Pozzati
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Reading circuit for a magnetic field sensor with sensitivity calibr...
Patent number
9,013,175
Issue date
Apr 21, 2015
STMicroelectronics S.r.l.
Carlo Alberto Romani
G01 - MEASURING TESTING
Information
Patent Grant
Magnetoresistive sensor with reduced parasitic capacitance, and method
Patent number
8,981,773
Issue date
Mar 17, 2015
STMicroelectronics S.r.l.
Enrico Pozzati
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Semiconductor device with integrated delay chain
Patent number
8,707,236
Issue date
Apr 22, 2014
STMicroelectronics, Inc.
Carlo Alberto Romani
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Process for generating a variable frequency signal, for instance fo...
Patent number
7,079,616
Issue date
Jul 18, 2006
STMicroelectronics S.r.l.
Corrado Castiglione
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND SYSTEM FOR MAGNETIZING ELEMENTS OF A MAGNETIC FIELD SENS...
Publication number
20220026508
Publication date
Jan 27, 2022
ROBERT BOSCH GmbH
Brad Engel
G01 - MEASURING TESTING
Information
Patent Application
READING CIRCUIT FOR A MAGNETIC FIELD SENSOR WITH SENSITITIVY CALIBR...
Publication number
20150362563
Publication date
Dec 17, 2015
STMicroelectronics S.r.l.
Carlo Alberto Romani
G01 - MEASURING TESTING
Information
Patent Application
BIASING CIRCUIT FOR A MAGNETIC FIELD SENSOR, AND CORRESPONDING BIAS...
Publication number
20150198680
Publication date
Jul 16, 2015
STMicroelectronics S.r.l.
Enrico Pozzati
G01 - MEASURING TESTING
Information
Patent Application
READING CIRCUIT FOR A MAGNETIC FIELD SENSOR WITH SENSITIVITY CALIBR...
Publication number
20150192644
Publication date
Jul 9, 2015
STMicroelectronics S.r.l.
Carlo Alberto Romani
G01 - MEASURING TESTING
Information
Patent Application
READING CIRCUIT WITH AUTOMATIC OFFSET COMPENSATION FOR A MAGNETIC-F...
Publication number
20120166122
Publication date
Jun 28, 2012
STMicroelectronics S.r.l.
Fabio Bottinelli
G01 - MEASURING TESTING
Information
Patent Application
MAGNETORESISTIVE SENSOR WITH REDUCED PARASITIC CAPACITANCE, AND METHOD
Publication number
20120161759
Publication date
Jun 28, 2012
STMicroelectronics S.r.l.
Enrico Pozzati
G01 - MEASURING TESTING
Information
Patent Application
READING CIRCUIT FOR A MAGNETIC FIELD SENSOR WITH SENSITIVITY CALIBR...
Publication number
20120153936
Publication date
Jun 21, 2012
STMicroelectronics S.r.l.
Carlo Alberto Romani
G01 - MEASURING TESTING
Information
Patent Application
BIASING CIRCUIT FOR A MAGNETIC FIELD SENSOR, AND CORRESPONDING BIAS...
Publication number
20120153937
Publication date
Jun 21, 2012
STMicroelectronics S.r.l.
Enrico Pozzati
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR READING DEVICE, SYSTEM AND METHOD
Publication number
20120158324
Publication date
Jun 21, 2012
STMicroelectronics S.r.l.
Carlo Alberto Romani
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE WITH INTEGRATED DELAY CHAIN
Publication number
20100164585
Publication date
Jul 1, 2010
STMicroelectronics Inc.
Carlo Alberto Romani
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Process for generating a variable frequency signal, for instance fo...
Publication number
20030039330
Publication date
Feb 27, 2003
Corrado Castiglione
H03 - BASIC ELECTRONIC CIRCUITRY