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Carlo Salvesen
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Massing, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Electrode arrangement, contact assembly for an electrode arrangemen...
Patent number
11,177,114
Issue date
Nov 16, 2021
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Matthias Firnkes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device with retarding field analyzer
Patent number
8,203,119
Issue date
Jun 19, 2012
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Ralf Degenhardt
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic lens assembly
Patent number
7,928,405
Issue date
Apr 19, 2011
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Pavel Adamec
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Electrostatic lens assembly
Patent number
7,872,239
Issue date
Jan 18, 2011
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Pavel Adamec
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electric-magnetic field-generating element and assembling method fo...
Patent number
7,429,740
Issue date
Sep 30, 2008
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Carlo Salvesen
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
ELEMENT FOR FAST MAGNETIC BEAM DEFLECTION
Publication number
20130306863
Publication date
Nov 21, 2013
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
Pavel ADAMEC
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Device With Retarding Field Analyzer
Publication number
20090200463
Publication date
Aug 13, 2009
Ralf Degenhardt
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC LENS ASSEMBLY
Publication number
20090039280
Publication date
Feb 12, 2009
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Pavel ADAMEC
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTROSTATIC LENS ASSEMBLY
Publication number
20090026384
Publication date
Jan 29, 2009
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Pavel ADAMEC
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electric-magnetic field-generating element and assembling method fo...
Publication number
20070023673
Publication date
Feb 1, 2007
ICT. INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUR HALBLEITERPRUFTECHNIK MBH
Carlo Salvesen
H01 - BASIC ELECTRIC ELEMENTS