Carlos L. Ygartua

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Palo Alto, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Multi-dimensional model of optical dispersion
- Patent number 11,060,982
- Issue date Jul 13, 2021
- KLA Corporation
- Natalia Malkova
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement of a highly absorbing film layer over highly re...
- Patent number 10,551,166
- Issue date Feb 4, 2020
- KLA-Tencor Corporation
- Carlos L. Ygartua
- G01 - MEASURING TESTING
Information Patent Grant
Determining thin film stack functional relationships for measuremen...
- Patent number 8,548,748
- Issue date Oct 1, 2013
- KLA-Tencor Corporation
- Carlos L. Ygartua
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring thermo-optically induced material phase-change...
- Patent number 8,111,384
- Issue date Feb 7, 2012
- KLA-Tencor Corporation
- Carlos L. Ygartua
- G01 - MEASURING TESTING
Information Patent Grant
Generating a model using global node optimization
- Patent number 7,801,713
- Issue date Sep 21, 2010
- KLA-Tencor Corporation
- Carlos L. Ygartua
- G01 - MEASURING TESTING
Information Patent Grant
Optical metrology on patterned samples
- Patent number 7,321,426
- Issue date Jan 22, 2008
- KLA-Tencor Technologies Corporation
- Leonid Poslavsky
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
- Publication number 20240418633
- Publication date Dec 19, 2024
- KLA Corporation
- Shova Subedi
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Systematic Error Compensation Across A Flee...
- Publication number 20240053280
- Publication date Feb 15, 2024
- KLA Corporation
- Ming Di
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Dimensional Model Of Optical Dispersion
- Publication number 20200292467
- Publication date Sep 17, 2020
- KLA Corporation
- Natalia Malkova
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optical Measurement Of A Highly Absorbing Film Layer Over Highly Re...
- Publication number 20190107384
- Publication date Apr 11, 2019
- KLA-Tencor Corporation
- Carlos L. Ygartua
- G01 - MEASURING TESTING
Information Patent Application
Determining Thin Film Stack Functional Relationships For Measuremen...
- Publication number 20130035872
- Publication date Feb 7, 2013
- KLA-Tencor Corporation
- Carlos L. Ygartua
- G01 - MEASURING TESTING
Information Patent Application
Method for Measuring Thermo-Optically Induced Material Phase-Change...
- Publication number 20100318212
- Publication date Dec 16, 2010
- KLA-Tencor Technologies Corporation
- Carlos L. Ygartua
- G01 - MEASURING TESTING