Carlos M. Chacon

Person

Orlando, FL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Non-contact method for determining quality of semiconductor dielect...
- Patent number 6,664,800
- Issue date Dec 16, 2003
- Agere Systems Inc.
- Carlos M. Chacon
- G01 - MEASURING TESTING
Information Patent Grant
Method and structure for oxide/silicon nitride interface substructu...
- Patent number 6,548,422
- Issue date Apr 15, 2003
- Agere Systems, INC
- Pradip K. Roy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of determining a trap density of a semiconductor/oxide inter...
- Patent number 6,391,668
- Issue date May 21, 2002
- Agere Systems Guardian Corp.
- Carlos M. Chacon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-line non-contact depletion capacitance measurement method and ap...
- Patent number 6,265,890
- Issue date Jul 24, 2001
- Lucent Technologies Inc.
- Carlos M. Chacon
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact method for determining the presence of a contaminant in...
- Patent number 6,255,128
- Issue date Jul 3, 2001
- Lucent Technologies Inc.
- Carlos M. Chacon
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact method for monitoring and controlling plasma charging d...
- Patent number 6,251,697
- Issue date Jun 26, 2001
- Agere Systems Guardian Corp.
- Carlos M. Chacon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-contact method for monitoring and controlling plasma charging d...
- Patent number 6,207,468
- Issue date Mar 27, 2001
- Lucent Technologies Inc.
- Carlos M. Chacon
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Structure for oxide/silicon nitride interface substructure improvem...
- Publication number 20030186499
- Publication date Oct 2, 2003
- Agere Systems Inc.
- Pradip K. Roy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND STRUCTURE FOR OXIDE/SILICON NITRIDE INTERFACE SUBSTRUCTU...
- Publication number 20030060058
- Publication date Mar 27, 2003
- Pradip K. Roy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Non-contact method for determining soft breakdown in dielectrics
- Publication number 20020121914
- Publication date Sep 5, 2002
- Carlos M. Chacon
- G01 - MEASURING TESTING

Carlos M. Chacon

Person

Patents Grantslast 30 patents

Non-contact method for determining quality of semiconductor dielect...

Method and structure for oxide/silicon nitride interface substructu...

Method of determining a trap density of a semiconductor/oxide inter...

In-line non-contact depletion capacitance measurement method and ap...

Non-contact method for determining the presence of a contaminant in...

Non-contact method for monitoring and controlling plasma charging d...

Non-contact method for monitoring and controlling plasma charging d...

Patents Applicationslast 30 patents

Structure for oxide/silicon nitride interface substructure improvem...

METHOD AND STRUCTURE FOR OXIDE/SILICON NITRIDE INTERFACE SUBSTRUCTU...

Non-contact method for determining soft breakdown in dielectrics