Carlos Strocchia-Rivera

Person

Highland, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
FinFET electrical characterization with enhanced hall effect and probe
- Patent number 9,972,548
- Issue date May 15, 2018
- GLOBALFOUNDRIES Inc.
- Carlos Strocchia-Rivera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Film thickness metrology
- Patent number 9,831,136
- Issue date Nov 28, 2017
- International Business Machines Corporation
- Carlos Strocchia-Rivera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lens coating/contamination electronic detection
- Patent number 9,459,226
- Issue date Oct 4, 2016
- GLOBALFOUNDRIES Inc.
- Carlos Strocchia-Rivera
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness metrology
- Patent number 9,263,348
- Issue date Feb 16, 2016
- International Business Machines Corporation
- Carlos Strocchia-Rivera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Film thickness metrology
- Patent number 9,224,661
- Issue date Dec 29, 2015
- International Business Machines Corporation
- Carlos Strocchia-Rivera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated optical illumination reference source
- Patent number 9,116,038
- Issue date Aug 25, 2015
- International Business Machines Corporation
- Carlos Strocchia-Rivera
- F21 - LIGHTING
Information Patent Grant
Non-linearity determination of positioning scanner of measurement tool
- Patent number 8,990,961
- Issue date Mar 24, 2015
- International Business Machines Corporation
- George W. Banke
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Non-linearity determination of positioning scanner of measurement tool
- Patent number 8,037,736
- Issue date Oct 18, 2011
- International Business Machines Corporation
- George W. Banke, Jr.
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for improved ellipsometric measurement of ultr...
- Patent number 7,508,511
- Issue date Mar 24, 2009
- International Business Machines Corporation
- Carlos Strocchia-Rivera
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for improved ellipsometric measurement of ultr...
- Patent number 7,394,539
- Issue date Jul 1, 2008
- International Business Machines Corporation
- Carlos Strocchia-Rivera
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for improved ellipsometric measurement of ultr...
- Patent number 7,280,209
- Issue date Oct 9, 2007
- International Business Machines Corporation
- Carlos Strocchia-Rivera
- G01 - MEASURING TESTING
Information Patent Grant
Method of monitoring ion implants by examination of an overlying ma...
- Patent number 6,462,817
- Issue date Oct 8, 2002
- Carlos Strocchia-Rivera
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FINFET ELECTRICAL CHARACTERIZATION WITH ENHANCED HALL EFFECT AND PROBE
- Publication number 20170030849
- Publication date Feb 2, 2017
- GLOBALFOUNDRIES INC.
- Carlos STROCCHIA-RIVERA
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS METROLOGY
- Publication number 20150371981
- Publication date Dec 24, 2015
- International Business Machines Corporation
- Carlos Strocchia-Rivera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LENS COATING/CONTAMINATION ELECTRONIC DETECTION
- Publication number 20150070032
- Publication date Mar 12, 2015
- International Business Machines Corporation
- Carlos Strocchia-Rivera
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED OPTICAL ILLUMINATION REFERENCE SOURCE
- Publication number 20150049336
- Publication date Feb 19, 2015
- International Business Machines Corporation
- CARLOS STROCCHIA-RIVERA
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS METROLOGY
- Publication number 20150014821
- Publication date Jan 15, 2015
- International Business Machines Corporation
- Carlos Strocchia-Rivera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FILM THICKNESS METROLOGY
- Publication number 20140191374
- Publication date Jul 10, 2014
- International Business Machines Corporation
- Carlos Strocchia-Rivera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-LINEARITY DETERMINATION OF POSITIONING SCANNER OF MEASUREMENT TOOL
- Publication number 20110314576
- Publication date Dec 22, 2011
- International Business Machines Corporation
- George W. Banke, JR.
- G01 - MEASURING TESTING
Information Patent Application
NON-LINEARITY DETERMINATION OF POSITIONING SCANNER OF MEASUREMENT TOOL
- Publication number 20090178472
- Publication date Jul 16, 2009
- George W. Banke, JR.
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR IMPROVED ELLIPSOMETRIC MEASUREMENT OF ULTR...
- Publication number 20080259333
- Publication date Oct 23, 2008
- International Business Machines Corporation
- Carlos Strocchia-Rivera
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR IMPROVED ELLIPSOMETRIC MEASUREMENT OF ULTR...
- Publication number 20070165228
- Publication date Jul 19, 2007
- International Business Machines Corporation
- Carlos Strocchia-Rivera
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR IMPROVED ELLIPSOMETRIC MEASUREMENT OF ULTR...
- Publication number 20060098197
- Publication date May 11, 2006
- Carlos Strocchia-Rivera
- G01 - MEASURING TESTING

Carlos Strocchia-Rivera

Person

Patents Grantslast 30 patents

FinFET electrical characterization with enhanced hall effect and probe

Film thickness metrology

Lens coating/contamination electronic detection

Film thickness metrology

Film thickness metrology

Integrated optical illumination reference source

Non-linearity determination of positioning scanner of measurement tool

Non-linearity determination of positioning scanner of measurement tool

Method and apparatus for improved ellipsometric measurement of ultr...

Method and apparatus for improved ellipsometric measurement of ultr...

Method and apparatus for improved ellipsometric measurement of ultr...

Method of monitoring ion implants by examination of an overlying ma...

Patents Applicationslast 30 patents

FINFET ELECTRICAL CHARACTERIZATION WITH ENHANCED HALL EFFECT AND PROBE

FILM THICKNESS METROLOGY

LENS COATING/CONTAMINATION ELECTRONIC DETECTION

INTEGRATED OPTICAL ILLUMINATION REFERENCE SOURCE

FILM THICKNESS METROLOGY

FILM THICKNESS METROLOGY

NON-LINEARITY DETERMINATION OF POSITIONING SCANNER OF MEASUREMENT TOOL

NON-LINEARITY DETERMINATION OF POSITIONING SCANNER OF MEASUREMENT TOOL

METHOD AND APPARATUS FOR IMPROVED ELLIPSOMETRIC MEASUREMENT OF ULTR...

METHOD AND APPARATUS FOR IMPROVED ELLIPSOMETRIC MEASUREMENT OF ULTR...

METHOD AND APPARATUS FOR IMPROVED ELLIPSOMETRIC MEASUREMENT OF ULTR...