Carmen Morales

Person

S. J., CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Concurrent measurement of critical dimension and overlay in semicon...
- Patent number 7,080,330
- Issue date Jul 18, 2006
- Advanced Micro Devices, Inc.
- Bryan Choo
- G01 - MEASURING TESTING
Information Patent Grant
System to determine suitability of sion arc surface for DUV resist...
- Patent number 6,597,463
- Issue date Jul 22, 2003
- Advanced Micro Devices, Inc.
- Bhanwar Singh
- G01 - MEASURING TESTING
Information Patent Grant
Monitor CMP process using scatterometry
- Patent number 6,594,024
- Issue date Jul 15, 2003
- Advanced Micro Devices, Inc.
- Bhanwar Singh
- B24 - GRINDING POLISHING
Information Patent Grant
Method and system for providing inorganic vapor surface treatment f...
- Patent number 6,515,342
- Issue date Feb 4, 2003
- Advanced Micro Devices, Inc.
- Subhash Gupta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated periodic focus and exposure calibration of a lithography...
- Patent number 6,501,534
- Issue date Dec 31, 2002
- Advanced Micro Devices, Inc.
- Bhanwar Singh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Cantilever assembly and scanning tip therefor with associated optic...
- Patent number 6,479,817
- Issue date Nov 12, 2002
- Advanced Micro Devices, Inc.
- Sanjay K. Yedur
- G01 - MEASURING TESTING
Information Patent Grant
System and method for facilitating determining suitable material la...
- Patent number 6,459,945
- Issue date Oct 1, 2002
- Advanced Micro Devices, Inc.
- Bhanwar Singh
- B24 - GRINDING POLISHING
Information Patent Grant
Scanning probe microscope having optical fiber spaced from point of hp
- Patent number 6,452,161
- Issue date Sep 17, 2002
- Advanced Micro Devices, Inc.
- Sanjay K. Yedur
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of manufacturing a semiconductor device with improved line w...
- Patent number 6,429,141
- Issue date Aug 6, 2002
- Advanced Micro Devices, Inc.
- Minh Van Ngo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Anti-reflective coating used in the fabrication of microcircuit str...
- Patent number 6,383,947
- Issue date May 7, 2002
- Advanced Micro Devices, Inc.
- Paul R. Besser
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Antireflective coating used in the fabrication of microcircuit stru...
- Patent number 6,165,855
- Issue date Dec 26, 2000
- Advanced Micro Devices, Inc.
- Paul R. Besser
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Hard mask for metal patterning
- Patent number 6,093,973
- Issue date Jul 25, 2000
- Advanced Micro Devices, Inc.
- Minh Van Ngo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for providing inorganic vapor surface treatment f...
- Patent number 6,066,578
- Issue date May 23, 2000
- Advanced Micro Devices, Inc.
- Subhash Gupta
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Focus monitor structure and method for lithography process
- Patent number 6,063,531
- Issue date May 16, 2000
- Advanced Micro Devices, Inc.
- Bhanwar Singh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Carmen Morales

Person

Patents Grantslast 30 patents

Concurrent measurement of critical dimension and overlay in semicon...

System to determine suitability of sion arc surface for DUV resist...

Monitor CMP process using scatterometry

Method and system for providing inorganic vapor surface treatment f...

Automated periodic focus and exposure calibration of a lithography...

Cantilever assembly and scanning tip therefor with associated optic...

System and method for facilitating determining suitable material la...

Scanning probe microscope having optical fiber spaced from point of hp

Method of manufacturing a semiconductor device with improved line w...

Anti-reflective coating used in the fabrication of microcircuit str...

Antireflective coating used in the fabrication of microcircuit stru...

Hard mask for metal patterning

Method and system for providing inorganic vapor surface treatment f...

Focus monitor structure and method for lithography process