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Carola Blaesing-Bangert
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Huettenberg, DE
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Patents Grants
last 30 patents
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Patent Grant
Substrate holder, and use of the substrate holder in a highly accur...
Patent number
7,081,963
Issue date
Jul 25, 2006
Leica Microsystems Semiconductor GmbH
Carola Blaesing-Bangert
G01 - MEASURING TESTING
Information
Patent Grant
Substrate holder, and use of the substrate holder in a highly accur...
Patent number
6,816,253
Issue date
Nov 9, 2004
Leica Microsystems Semiconductor GmbH
Carola Blaesing-Bangert
G01 - MEASURING TESTING
Information
Patent Grant
Coordinate measuring stage and coordinate measuring instrument
Patent number
6,778,260
Issue date
Aug 17, 2004
Leica Microsystems Semiconductor GmbH
Carola Blaesing-Bangert
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Apparatus and method for loading substrates of various sizes into s...
Patent number
6,441,899
Issue date
Aug 27, 2002
Leica Microsystems Wetzlar GmbH
Carola Blaesing-Bangert
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device and method for delivering various transparent substrates int...
Patent number
6,377,870
Issue date
Apr 23, 2002
Leica Microsystems Wetzlar GmbH
Carola Blaesing-Bangert
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and device for measuring structures on a transparent substrate
Patent number
6,323,953
Issue date
Nov 27, 2001
Leica Microsystems Wetzlar GmbH
Carola Blaesing-Bangert
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method for measuring the positions of structures on a mask surface
Patent number
6,226,087
Issue date
May 1, 2001
Leica Microsystems Wetzlar GmbH
Carola Blaesing-Bangert
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
Substrate holder, and use of the substrate holder in a highly accur...
Publication number
20040179210
Publication date
Sep 16, 2004
Leica Microsystems Wetzlar GmbH.
Carola Blaesing-Bangert
G01 - MEASURING TESTING
Information
Patent Application
Method and microscope for detecting images of an object
Publication number
20040120579
Publication date
Jun 24, 2004
Leica Microsystems Semiconductor GmbH
Franz Cemic
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Coordinate measuring stage and coordinate measuring instrument
Publication number
20030053037
Publication date
Mar 20, 2003
Leica Microsystems Semiconductor GmbH
Carola Blaesing-Bangert
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY