Carsten MICHAELSEN

Person

Artlenburg, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Analytical X-ray tube with high thermal performance
- Patent number 10,847,336
- Issue date Nov 24, 2020
- Roger D. Durst
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of adjusting the primary side of an X-ray diffractometer
- Patent number 10,598,615
- Issue date Mar 24, 2020
- Andreas Kleine
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray apparatus with deflectable electron beam
- Patent number 10,049,850
- Issue date Aug 14, 2018
- Bruker Axs GmbH
- Christoph Ollinger
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Point-line converter
- Patent number 8,848,870
- Issue date Sep 30, 2014
- Bruker Axs GmbH
- Lutz Bruegemann
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray analysis instrument with adjustable aperture window
- Patent number 7,983,388
- Issue date Jul 19, 2011
- Incoatec GmbH
- Carsten Michaelsen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and device for aligning an optical element
- Patent number 7,511,902
- Issue date Mar 31, 2009
- Incoatec GmbH
- Gerd Wings
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multiple wavelength X-ray source
- Patent number 7,317,784
- Issue date Jan 8, 2008
- Broker AXS, Inc
- Roger D. Durst
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for manufacturing a reflector for X-ray radiation
- Patent number 7,242,746
- Issue date Jul 10, 2007
- Incoatec GmbH
- Carsten Michaelsen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Apparatus and method for the analysis of atomic and molecular eleme...
- Patent number 7,113,567
- Issue date Sep 26, 2006
- GKSS-Forschungszentrum Geesthacht
- Carsten Michaelsen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Mirror element for the reflection of x-rays
- Patent number 6,920,199
- Issue date Jul 19, 2005
- GKSS Forschungszentrum Geesthacht GmbH
- Carsten Michaelsen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Apparatus and method for the analysis of atomic and molecular eleme...
- Patent number 6,650,728
- Issue date Nov 18, 2003
- Forschungszentrum Geesthacht
- Carsten Michaelsen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Device and method for analyzing atomic and/or molecular elements by...
- Patent number 6,628,748
- Issue date Sep 30, 2003
- GKSS-Forschungszentrum Geesthacht GmbH
- Carsten Michaelsen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray analysis apparatus with a graded multilayer mirror
- Patent number 6,226,349
- Issue date May 1, 2001
- Bruker AXS Analytical X-ray Systems GmbH
- Manfred Schuster
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY TUBE WITH FLEXIBLE INTENSITY ADJUSTMENT
- Publication number 20240062985
- Publication date Feb 22, 2024
- INCOATEC GmbH
- Paul Radcliffe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYTICAL X-RAY TUBE WITH HIGH THERMAL PERFORMANCE
- Publication number 20190057832
- Publication date Feb 21, 2019
- Bruker AXS, GmbH
- Roger D. DURST
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF ADJUSTING THE PRIMARY SIDE OF AN X-RAY DIFFRACTOMETER
- Publication number 20170160212
- Publication date Jun 8, 2017
- INCOATEC GmbH
- Andreas KLEINE
- G01 - MEASURING TESTING
Information Patent Application
X-ray apparatus with deflectable electron beam
- Publication number 20150380202
- Publication date Dec 31, 2015
- Bruker AXS GmbH
- Christoph Ollinger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-ray apparatus with deflectable electron beam
- Publication number 20140161233
- Publication date Jun 12, 2014
- Christopher Ollinger
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Point-line converter
- Publication number 20120140897
- Publication date Jun 7, 2012
- Bruker AXS GmbH
- Lutz Bruegemann
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-ray analysis instrument with adjustable aperture window
- Publication number 20100086104
- Publication date Apr 8, 2010
- INCOATEC GmbH
- Carsten Michaelsen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Method and device for aligning an optical element
- Publication number 20070236815
- Publication date Oct 11, 2007
- INCOATEC GmbH
- Gerd Wings
- G02 - OPTICS
Information Patent Application
Multiple wavelength X-ray source
- Publication number 20070165780
- Publication date Jul 19, 2007
- Bruker AXS, Inc.
- Roger D. Durst
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing a reflector for X-ray radiation
- Publication number 20060133569
- Publication date Jun 22, 2006
- INCOATEC GmbH
- Carsten Michaelsen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Reflector X-ray radiation
- Publication number 20040096034
- Publication date May 20, 2004
- INCOATEC GmbH
- Carsten Michaelsen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Apparatus and method for the analysis of atomic and molecular eleme...
- Publication number 20040013227
- Publication date Jan 22, 2004
- Carsten Michaelsen
- G02 - OPTICS
Information Patent Application
Mirror element for the reflection of x-rays
- Publication number 20030185341
- Publication date Oct 2, 2003
- Carsten Michaelsen
- G02 - OPTICS
Information Patent Application
Device and method for analyzing atomic and/or molecular elements by...
- Publication number 20030103596
- Publication date Jun 5, 2003
- Carsten Michaelsen
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for the analysis of atomic and molecular eleme...
- Publication number 20030026383
- Publication date Feb 6, 2003
- Carsten Michaelsen
- B82 - NANO-TECHNOLOGY
Information Patent Application
Device for the reflection of x-rays
- Publication number 20030016784
- Publication date Jan 23, 2003
- Carsten Michaelsen
- B82 - NANO-TECHNOLOGY

Carsten MICHAELSEN

Person

Patents Grantslast 30 patents

Analytical X-ray tube with high thermal performance

Method of adjusting the primary side of an X-ray diffractometer

X-ray apparatus with deflectable electron beam

Point-line converter

X-ray analysis instrument with adjustable aperture window

Method and device for aligning an optical element

Multiple wavelength X-ray source

Method for manufacturing a reflector for X-ray radiation

Apparatus and method for the analysis of atomic and molecular eleme...

Mirror element for the reflection of x-rays

Apparatus and method for the analysis of atomic and molecular eleme...

Device and method for analyzing atomic and/or molecular elements by...

X-ray analysis apparatus with a graded multilayer mirror

Patents Applicationslast 30 patents

X-RAY TUBE WITH FLEXIBLE INTENSITY ADJUSTMENT

ANALYTICAL X-RAY TUBE WITH HIGH THERMAL PERFORMANCE

METHOD OF ADJUSTING THE PRIMARY SIDE OF AN X-RAY DIFFRACTOMETER

X-ray apparatus with deflectable electron beam

X-ray apparatus with deflectable electron beam

Point-line converter

X-ray analysis instrument with adjustable aperture window

Method and device for aligning an optical element

Multiple wavelength X-ray source

Method for manufacturing a reflector for X-ray radiation

Reflector X-ray radiation

Apparatus and method for the analysis of atomic and molecular eleme...

Mirror element for the reflection of x-rays

Device and method for analyzing atomic and/or molecular elements by...

Apparatus and method for the analysis of atomic and molecular eleme...

Device for the reflection of x-rays