Carsten Ohlhoff

Person

Dresden, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Test apparatus and method for testing a circuit unit
- Patent number 7,574,643
- Issue date Aug 11, 2009
- Infineon Technologies AG
- Stefan Gollmer
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for masking known fails during memory tests re...
- Patent number 7,490,274
- Issue date Feb 10, 2009
- Infineon Technologies AG
- Jochen Hoffmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory module, test system and method for testing one or a pluralit...
- Patent number 7,231,562
- Issue date Jun 12, 2007
- Infineon Technologies AG
- Carsten Ohlhoff
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit and method for testing an integrated memory circuit
- Patent number 7,197,678
- Issue date Mar 27, 2007
- Infineon Technologies AG
- Carsten Ohlhoff
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for masking known fails during memory tests re...
- Patent number 7,137,049
- Issue date Nov 14, 2006
- Infineon Technologies AG
- Jochen Hoffmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Data generator for generating test data for word-oriented semicondu...
- Patent number 7,120,841
- Issue date Oct 10, 2006
- Infineon Technologies AG
- Carsten Ohlhoff
- G11 - INFORMATION STORAGE
Information Patent Grant
Test device, test system and method for testing a memory circuit
- Patent number 7,107,501
- Issue date Sep 12, 2006
- Infineon Technologies AG
- Carsten Ohlhoff
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic memory and method for testing a dynamic memory
- Patent number 7,092,303
- Issue date Aug 15, 2006
- Infineon Technologies AG
- Carsten Ohlhoff
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated semiconductor circuit configuration
- Patent number 6,891,431
- Issue date May 10, 2005
- Infineon Technologies AG
- Peter Beer
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit having a current measuring unit
- Patent number 6,756,787
- Issue date Jun 29, 2004
- Infineon Technologies AG
- Carsten Ohlhoff
- G01 - MEASURING TESTING
Information Patent Grant
Memory module with improved electrical properties
- Patent number 6,670,665
- Issue date Dec 30, 2003
- Infineon Technologies AG
- Peter Beer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor chip with trimmable oscillator
- Patent number 6,671,221
- Issue date Dec 30, 2003
- Infineon Technologies AG
- Peter Beer
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing device for testing a memory
- Patent number 6,661,718
- Issue date Dec 9, 2003
- Infineon Technologies AG
- Carsten Ohlhoff
- G11 - INFORMATION STORAGE
Information Patent Grant
Configuration for measurement of internal voltages of an integrated...
- Patent number 6,657,452
- Issue date Dec 2, 2003
- Infineon Technologies AG
- Peter Beer
- G01 - MEASURING TESTING
Information Patent Grant
Memory chip having a test mode and method for checking memory cells...
- Patent number 6,639,856
- Issue date Oct 28, 2003
- Infineon Technologies AG
- Peter Beer
- G11 - INFORMATION STORAGE
Information Patent Grant
Configuration and process for testing a multiplicity of semiconduct...
- Patent number 6,549,028
- Issue date Apr 15, 2003
- Infineon Technologies AG
- Carsten Ohlhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Configuration for trimming reference voltages in semiconductor chip...
- Patent number 6,504,394
- Issue date Jan 7, 2003
- Infineon Technologies AG
- Carsten Ohlhoff
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE TEST SYSTEM AND METHOD
- Publication number 20080246505
- Publication date Oct 9, 2008
- QIMONDA AG
- Markus Kollwitz
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for masking known fails during memory tests re...
- Publication number 20060242492
- Publication date Oct 26, 2006
- Jochen Hoffmann
- G11 - INFORMATION STORAGE
Information Patent Application
Test apparatus and method for testing a circuit unit
- Publication number 20060202706
- Publication date Sep 14, 2006
- Infineon Technologies AG
- Stefan Gollmer
- G01 - MEASURING TESTING
Information Patent Application
Electronic circuit
- Publication number 20060120199
- Publication date Jun 8, 2006
- Carsten Ohlhoff
- G11 - INFORMATION STORAGE
Information Patent Application
Memory module, test system and method for testing one or a pluralit...
- Publication number 20040260987
- Publication date Dec 23, 2004
- Carsten Ohlhoff
- G11 - INFORMATION STORAGE
Information Patent Application
Dynamic memory and method for testing a dynamic memory
- Publication number 20040233745
- Publication date Nov 25, 2004
- Carsten Ohlhoff
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for masking known fails during memory tests re...
- Publication number 20040221210
- Publication date Nov 4, 2004
- Jochen Hoffmann
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated semiconductor circuit configuration
- Publication number 20040066209
- Publication date Apr 8, 2004
- Peter Beer
- G01 - MEASURING TESTING
Information Patent Application
Test circuit and method for testing an integrated memory circuit
- Publication number 20040015757
- Publication date Jan 22, 2004
- Carsten Ohlhoff
- G11 - INFORMATION STORAGE
Information Patent Application
Test device, test system and method for testing a memory circuit
- Publication number 20030226074
- Publication date Dec 4, 2003
- Carsten Ohlhoff
- G11 - INFORMATION STORAGE
Information Patent Application
Memory module with improved electrical properties
- Publication number 20030146461
- Publication date Aug 7, 2003
- Peter Beer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit having a current measuring unit
- Publication number 20030057987
- Publication date Mar 27, 2003
- Carsten Ohlhoff
- G01 - MEASURING TESTING
Information Patent Application
Data generator for generating test data for word-oriented semicondu...
- Publication number 20030018934
- Publication date Jan 23, 2003
- Carsten Ohlhoff
- G11 - INFORMATION STORAGE
Information Patent Application
Memory chip having a test mode and method for checking memory cells...
- Publication number 20020191454
- Publication date Dec 19, 2002
- Peter Beer
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor chip with trimmable oscillator
- Publication number 20020177267
- Publication date Nov 28, 2002
- Peter Beer
- G11 - INFORMATION STORAGE
Information Patent Application
Testing device for testing a memory
- Publication number 20020149975
- Publication date Oct 17, 2002
- Carsten Ohlhoff
- G11 - INFORMATION STORAGE
Information Patent Application
Configuration for measurement of internal voltages in an integrated...
- Publication number 20010005143
- Publication date Jun 28, 2001
- Peter Beer
- G01 - MEASURING TESTING
Information Patent Application
Configuration for trimming reference voltages in semiconductor chip...
- Publication number 20010004126
- Publication date Jun 21, 2001
- Carsten Ohlhoff
- H01 - BASIC ELECTRIC ELEMENTS

Carsten Ohlhoff

Person

Patents Grantslast 30 patents

Test apparatus and method for testing a circuit unit

Method and apparatus for masking known fails during memory tests re...

Memory module, test system and method for testing one or a pluralit...

Test circuit and method for testing an integrated memory circuit

Method and apparatus for masking known fails during memory tests re...

Data generator for generating test data for word-oriented semicondu...

Test device, test system and method for testing a memory circuit

Dynamic memory and method for testing a dynamic memory

Integrated semiconductor circuit configuration

Integrated circuit having a current measuring unit

Memory module with improved electrical properties

Semiconductor chip with trimmable oscillator

Testing device for testing a memory

Configuration for measurement of internal voltages of an integrated...

Memory chip having a test mode and method for checking memory cells...

Configuration and process for testing a multiplicity of semiconduct...

Configuration for trimming reference voltages in semiconductor chip...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE TEST SYSTEM AND METHOD

Method and apparatus for masking known fails during memory tests re...

Test apparatus and method for testing a circuit unit

Electronic circuit

Memory module, test system and method for testing one or a pluralit...

Dynamic memory and method for testing a dynamic memory

Method and apparatus for masking known fails during memory tests re...

Integrated semiconductor circuit configuration

Test circuit and method for testing an integrated memory circuit

Test device, test system and method for testing a memory circuit

Memory module with improved electrical properties

Integrated circuit having a current measuring unit

Data generator for generating test data for word-oriented semicondu...

Memory chip having a test mode and method for checking memory cells...

Semiconductor chip with trimmable oscillator

Testing device for testing a memory

Configuration for measurement of internal voltages in an integrated...

Configuration for trimming reference voltages in semiconductor chip...