Casey Feinstein

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San Francisco, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for characterizing microelectromechanical devi...
- Patent number 7,345,806
- Issue date Mar 18, 2008
- Texas Instruments Incorporated
- Dmitri Simonian
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for characterizing microelectromechanical devi...
- Publication number 20050286105
- Publication date Dec 29, 2005
- Dmitri Simonian
- G01 - MEASURING TESTING