Catherine Vartuli

Person

Windermere, FL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for detecting defects in a material and a system for accompl...
- Patent number 6,870,950
- Issue date Mar 22, 2005
- Agere Systems Inc.
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Grant
Calibration standard for high resolution electron microscopy
- Patent number 6,750,447
- Issue date Jun 15, 2004
- Agere Systems, INC
- Erik Cho Houge
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor manufacturing using modular substrates
- Patent number 6,713,409
- Issue date Mar 30, 2004
- Agere Systems Inc.
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Abnormal photoresist line/space profile detection through signal pr...
- Patent number 6,708,574
- Issue date Mar 23, 2004
- Agere Systems, INC
- Erik Cho Houge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for minimizing semiconductor wafer contamination
- Patent number 6,695,572
- Issue date Feb 24, 2004
- Agere Systems Inc.
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer particle counter
- Patent number 6,633,032
- Issue date Oct 14, 2003
- Agere Systems Inc.
- Erik Cho Houge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of focused ion beam pattern transfer using a smart dynamic t...
- Patent number 6,627,885
- Issue date Sep 30, 2003
- Agere Systems Inc.
- John M. McIntosh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray system
- Patent number 6,606,371
- Issue date Aug 12, 2003
- Agere Systems Inc.
- Michael Antonell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Calibration method for quantitative elemental analysis
- Patent number 6,603,119
- Issue date Aug 5, 2003
- Agere Systems Inc.
- Lucille A. Giannuzzi
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining a crystallographic quality of a material loca...
- Patent number 6,577,970
- Issue date Jun 10, 2003
- Agere Systems Inc.
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring system for determining progress in a fabrication activity
- Patent number 6,569,690
- Issue date May 27, 2003
- Agere Systems Guardian Corp.
- Erik Cho Houge
- B24 - GRINDING POLISHING
Information Patent Grant
Modular semiconductor substrates
- Patent number 6,534,851
- Issue date Mar 18, 2003
- Agere Systems, INC
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration method for quantitative elemental analysis
- Patent number 6,519,543
- Issue date Feb 11, 2003
- Agere Systems Inc.
- Lucille A. Giannuzzi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope/energy dispersive spectroscopy sample...
- Patent number 6,362,475
- Issue date Mar 26, 2002
- Agere Systems Guardian Corp.
- Jeffrey B. Bindell
- G01 - MEASURING TESTING
Information Patent Grant
Method of sectioning of photoresist for shape evaluation
- Patent number 6,265,235
- Issue date Jul 24, 2001
- Lucent Technologies, Inc.
- John M. McIntosh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for holding and aligning a scanning electron microscope s...
- Patent number 6,246,060
- Issue date Jun 12, 2001
- Agere Systems Guardian Corp.
- Michael A. Ackeret
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of monitoring a patterned transfer process using line width...
- Patent number 6,225,639
- Issue date May 1, 2001
- Agere Systems Guardian Corp.
- Thomas E. Adams
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ABNORMAL PHOTORESIST LINE/SPACE PROFILE DETECTION THROUGH SIGNAL PR...
- Publication number 20030219916
- Publication date Nov 27, 2003
- Erik Cho Houge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Calibration standard for high resolution electron microscopy
- Publication number 20030193022
- Publication date Oct 16, 2003
- Erik Cho Houge
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor manufacturing using modular substrates
- Publication number 20030107117
- Publication date Jun 12, 2003
- Agere Systems Inc.
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for minimizing semiconductor wafer contamination
- Publication number 20030063967
- Publication date Apr 3, 2003
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Laboratory specimen sampler with integrated specimen mount
- Publication number 20020150509
- Publication date Oct 17, 2002
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Application
Method for detecting defects in a material and a system for accompl...
- Publication number 20020131631
- Publication date Sep 19, 2002
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Application
Method of determining a crystallographic quality of a material loca...
- Publication number 20020128789
- Publication date Sep 12, 2002
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Application
Mass spectrometer particle counter
- Publication number 20020063201
- Publication date May 30, 2002
- Erik Cho Houge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-ray system
- Publication number 20010043667
- Publication date Nov 22, 2001
- Michael Antonell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Catherine Vartuli

Person

Patents Grantslast 30 patents

Method for detecting defects in a material and a system for accompl...

Calibration standard for high resolution electron microscopy

Semiconductor manufacturing using modular substrates

Abnormal photoresist line/space profile detection through signal pr...

Method and apparatus for minimizing semiconductor wafer contamination

Mass spectrometer particle counter

Method of focused ion beam pattern transfer using a smart dynamic t...

X-ray system

Calibration method for quantitative elemental analysis

Method of determining a crystallographic quality of a material loca...

Monitoring system for determining progress in a fabrication activity

Modular semiconductor substrates

Calibration method for quantitative elemental analysis

Scanning electron microscope/energy dispersive spectroscopy sample...

Method of sectioning of photoresist for shape evaluation

Apparatus for holding and aligning a scanning electron microscope s...

Method of monitoring a patterned transfer process using line width...

Patents Applicationslast 30 patents

ABNORMAL PHOTORESIST LINE/SPACE PROFILE DETECTION THROUGH SIGNAL PR...

Calibration standard for high resolution electron microscopy

Semiconductor manufacturing using modular substrates

Method and apparatus for minimizing semiconductor wafer contamination

Laboratory specimen sampler with integrated specimen mount

Method for detecting defects in a material and a system for accompl...

Method of determining a crystallographic quality of a material loca...

Mass spectrometer particle counter

X-ray system