Cecelia Anne Campochiaro

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method of preparing integrated circuits for backside pro...
- Patent number 11,605,525
- Issue date Mar 14, 2023
- FEI Company
- James Vickers
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit analysis systems and methods with localized evac...
- Patent number 10,373,795
- Issue date Aug 6, 2019
- FEI Company
- Yakov Bobrov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for preparation of samples for sub-surface defe...
- Patent number 9,318,395
- Issue date Apr 19, 2016
- KLA-Tencor Corporation
- Cecelia Campochiaro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device property extraction, generation, visualization...
- Patent number 8,611,639
- Issue date Dec 17, 2013
- KLA-Tencor Technologies Corp.
- Ashok Kulkarni
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for creating persistent data for a wafer and fo...
- Patent number 8,126,255
- Issue date Feb 28, 2012
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Flexible hybrid defect classification for semiconductor manufacturing
- Patent number 7,142,992
- Issue date Nov 28, 2006
- KLA-Tencor Technologies Corp.
- Patrick Huet
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
System and method of preparing integrated circuits for backside pro...
- Publication number 20210098228
- Publication date Apr 1, 2021
- FEI Company
- James VICKERS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method of preparing integrated circuits for backside pro...
- Publication number 20190287762
- Publication date Sep 19, 2019
- FEI Company
- James VICKERS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method of preparing integrated circuits for backside pro...
- Publication number 20190227119
- Publication date Jul 25, 2019
- FEI Company
- James VICKERS
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT ANALYSIS SYSTEMS AND METHODS WITH LOCALIZED EVAC...
- Publication number 20180197713
- Publication date Jul 12, 2018
- FEI Company
- Yakov Bobrov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PREPARATION OF SAMPLES FOR SUB-SURFACE DEFE...
- Publication number 20130137193
- Publication date May 30, 2013
- KLA-Tencor Corporation
- Cecelia CAMPOCHIARO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE PROPERTY EXTRACTION, GENERATION, VISUALIZATION...
- Publication number 20090037134
- Publication date Feb 5, 2009
- Ashok Kulkarni
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE HYBRID DEFECT CLASSIFICATION FOR SEMICONDUCTOR MANUFACTURING
- Publication number 20060265145
- Publication date Nov 23, 2006
- Patrick Huet
- G06 - COMPUTING CALCULATING COUNTING

Cecelia Anne Campochiaro

Person

Patents Grantslast 30 patents

System and method of preparing integrated circuits for backside pro...

Integrated circuit analysis systems and methods with localized evac...

Systems and methods for preparation of samples for sub-surface defe...

Semiconductor device property extraction, generation, visualization...

Systems and methods for creating persistent data for a wafer and fo...

Flexible hybrid defect classification for semiconductor manufacturing

Patents Applicationslast 30 patents

System and method of preparing integrated circuits for backside pro...

System and method of preparing integrated circuits for backside pro...

System and method of preparing integrated circuits for backside pro...

INTEGRATED CIRCUIT ANALYSIS SYSTEMS AND METHODS WITH LOCALIZED EVAC...

SYSTEMS AND METHODS FOR PREPARATION OF SAMPLES FOR SUB-SURFACE DEFE...

SEMICONDUCTOR DEVICE PROPERTY EXTRACTION, GENERATION, VISUALIZATION...

FLEXIBLE HYBRID DEFECT CLASSIFICATION FOR SEMICONDUCTOR MANUFACTURING