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Patent Grant
Method of converting high-level test specification language to low-...
Patent number
10,539,609
Issue date
Jan 21, 2020
NXP USA, INC.
Arthur Freitas
G01 - MEASURING TESTING
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TESTING OF SEMICONDUCTOR DEVICES
Publication number
20160161544
Publication date
Jun 9, 2016
FREESCALE SEMICONDUCTOR, INC.
ARTHUR FREITAS
G01 - MEASURING TESTING