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Cedric H. WU
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Bethesda, MD, US
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Patents Grants
last 30 patents
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Patent Grant
Magnetometer apparatus
Patent number
10,935,611
Issue date
Mar 2, 2021
Lockheed Martin Corporation
Joseph W. Hahn
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
MAGNETO-OPTICAL DEFECT CENTER SENSOR WITH VIBRATION INSENSITIVE PRE...
Publication number
20190018077
Publication date
Jan 17, 2019
Lockheed Martin Corporation
Cedric H. WU
G01 - MEASURING TESTING
Information
Patent Application
MAGNETOMETER WITH THERMAL ELECTRIC COOLING OF THE EXCITATION LIGHT...
Publication number
20190018085
Publication date
Jan 17, 2019
Lockheed Martin Corporation
Cedric H. WU
G01 - MEASURING TESTING
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Patent Application
MAGNETOMETER APPARATUS
Publication number
20190018076
Publication date
Jan 17, 2019
Lockheed Martin Corporation
Joseph W. HAHN
G01 - MEASURING TESTING