Cesar A. Sciammarella

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Chicago, IL, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for analyzing displacements and contouring of sur...
- Patent number 8,054,471
- Issue date Nov 8, 2011
- Cesar A. Sciammarella
- G01 - MEASURING TESTING
Information Patent Grant
Holomoire strain analyzer
- Patent number 5,671,042
- Issue date Sep 23, 1997
- Illinois Institute of Technology
- Cesar A. Sciammarella
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and method for analyzing displacements and contouring of sur...
- Publication number 20080075328
- Publication date Mar 27, 2008
- Cesar A. Sciammarella
- G01 - MEASURING TESTING