Cesar Javier Lockhart De La Rosa

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Haacht, BE

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring the trap density in a 2-dimensional semiconduc...
- Patent number 11,898,958
- Issue date Feb 13, 2024
- Imec VZW
- Alessandra Leonhardt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MEASURING THE TRAP DENSITY IN A 2-DIMENSIONAL SEMICONDUC...
- Publication number 20210356399
- Publication date Nov 18, 2021
- IMEC vzw
- Alessandra Leonhardt
- G01 - MEASURING TESTING