ChaeHo SHIN

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Hwaseong-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Measuring method for atomic force microscope
- Patent number 10,191,081
- Issue date Jan 29, 2019
- Korea Research Institute of Standards and Science
- Byong Chon Park
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING METHOD FOR ATOMIC FORCE MICROSCOPE
- Publication number 20170052210
- Publication date Feb 23, 2017
- Korea Research Institute of Standards and Science
- Byong Chon PARK
- G01 - MEASURING TESTING