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CHAKRAVARTHY K. ALLAMSETTY
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MILPITAS, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for testing a circuit implemented on a programmab...
Patent number
6,618,686
Issue date
Sep 9, 2003
Xilinx, Inc.
Chakravarthy K. Allamsetty
G01 - MEASURING TESTING
Information
Patent Grant
System and method for verifying configuration of a programmable log...
Patent number
6,553,523
Issue date
Apr 22, 2003
Jeffrey V. Lindholm
G01 - MEASURING TESTING
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Patent Grant
System and method for reading data from a programmable logic device
Patent number
6,425,077
Issue date
Jul 23, 2002
Xilinx, Inc.
Thach-Kinh Le
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SYSTEM AND METHOD FOR TESTING A CIRCUIT IMPLEMENTED ON A PROGRAMMAB...
Publication number
20030078752
Publication date
Apr 24, 2003
CHAKRAVARTHY K. ALLAMSETTY
G01 - MEASURING TESTING