Chan Chen

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Hefei, CN

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Patents Grantslast 30 patents

Information Patent Grant
Voltage output test circuit, voltage divider output circuit, and me...
- Patent number 12,243,613
- Issue date Mar 4, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Ring oscillator and test method
- Patent number 12,113,535
- Issue date Oct 8, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chan Chen
- G01 - MEASURING TESTING
Information Patent Grant
Ring oscillator
- Patent number 11,855,637
- Issue date Dec 26, 2023
- Changxin Memory Technologies, Inc.
- Chan Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Delay circuit and delay structure
- Patent number 11,451,219
- Issue date Sep 20, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Weibing Shang
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
RING OSCILLATOR AND TEST METHOD
- Publication number 20230299752
- Publication date Sep 21, 2023
- Changxin Memory Technologies, Inc.
- Chan CHEN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
VOLTAGE OUTPUT TEST CIRCUIT, VOLTAGE DIVIDER OUTPUT CIRCUIT, AND ME...
- Publication number 20230267967
- Publication date Aug 24, 2023
- Changxin Memory Technologies, Inc.
- Chan CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
RING OSCILLATOR
- Publication number 20230253958
- Publication date Aug 10, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Chan CHEN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DELAY CIRCUIT AND DELAY STRUCTURE
- Publication number 20220094344
- Publication date Mar 24, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Weibing Shang
- H03 - BASIC ELECTRONIC CIRCUITRY