Chan-Sik KWON

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Asan-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Crack detection chip and crack detection method using the same
- Patent number 11,740,276
- Issue date Aug 29, 2023
- Samsung Electronics Co., Ltd.
- Chan-Sik Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crack detection chip and crack detection method using the same
- Patent number 10,788,528
- Issue date Sep 29, 2020
- Samsung Electronics Co., Ltd.
- Chan-Sik Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus for semiconductor package
- Patent number 9,255,959
- Issue date Feb 9, 2016
- Samsung Electronics Co., Ltd.
- Chan-Sik Kwon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CRACK DETECTION CHIP AND CRACK DETECTION METHOD USING THE SAME
- Publication number 20210018553
- Publication date Jan 21, 2021
- Samsung Electronics Co., Ltd.
- Chan-Sik Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRACK DETECTION CHIP AND CRACK DETECTION METHOD USING THE SAME
- Publication number 20190265291
- Publication date Aug 29, 2019
- Samsung Electronics Co., Ltd.
- Chan-Sik Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST APPARATUS FOR SEMICONDUCTOR PACKAGE
- Publication number 20140062496
- Publication date Mar 6, 2014
- Samsung Electronics Co., Ltd.
- Chan-Sik KWON
- G01 - MEASURING TESTING