Chandra Saru Saravanan

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Characterizing residue on a sample
- Patent number 7,362,448
- Issue date Apr 22, 2008
- Nanometrics Incorporated
- Zhuan Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Imaging Diffraction Based Overlay
- Publication number 20090296075
- Publication date Dec 3, 2009
- Nanometrics Incorporated
- Jiangtao Hu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY