Chang Chan Yang

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Zhubei, TW

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Patents Grantslast 30 patents

Information Patent Grant
System and method for testing for defects in a semiconductor memory...
- Patent number 8,605,525
- Issue date Dec 10, 2013
- Macronix International Co., Ltd.
- Yin Chin Huang
- G11 - INFORMATION STORAGE
Information Patent Grant
Test method for screening local bit-line defects in a memory array
- Patent number 8,498,168
- Issue date Jul 30, 2013
- Macronix International Co., Ltd.
- Yin Chin Huang
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TEST METHOD FOR SCREENING LOCAL BIT-LINE DEFECTS IN A MEMORY ARRAY
- Publication number 20120263002
- Publication date Oct 18, 2012
- MACRONIX INTERNATIONAL CO., LTD
- Yin Chin Huang
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD FOR TESTING FOR DEFECTS IN A SEMICONDUCTOR MEMORY...
- Publication number 20120127797
- Publication date May 24, 2012
- Macronix International Co., Ltd.
- Yin Chin Huang
- G11 - INFORMATION STORAGE